Probability that energy level is occupied

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Discussion Overview

The discussion centers on the probability of electron occupancy in energy levels, particularly in the context of semiconductors and the application of Fermi-Dirac statistics. Participants explore different statistical distributions relevant to this topic, including Fermi-Dirac, Bose-Einstein, and Maxwell-Boltzmann statistics, and their applicability under varying temperature conditions.

Discussion Character

  • Technical explanation
  • Debate/contested
  • Mathematical reasoning

Main Points Raised

  • One participant presents the probability equations for excited states and energy level occupancy in semiconductors, questioning which is more appropriate to use.
  • Another participant notes that Fermi-Dirac and Bose-Einstein distributions differ by a factor of one, which can be neglected under certain conditions, specifically at high temperatures or low concentrations.
  • A later reply suggests that the choice of distribution depends on temperature, indicating that classical limits apply at high temperatures.
  • Participants discuss specific energy values for semiconductors, providing rough calculations to illustrate the application of these distributions in practical scenarios.

Areas of Agreement / Disagreement

Participants express differing views on the appropriate statistical model to use based on temperature and concentration conditions, indicating that multiple competing views remain without a clear consensus.

Contextual Notes

There are limitations regarding the assumptions made about temperature and concentration, as well as the specific conditions under which the different statistical models are applicable. The discussion does not resolve these assumptions or their implications.

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The probability that an electron is in an excited state is given:



P = e^-(energy difference)/kt

and the probability that an energy level is occupied in semi conductors is:


p = 1/ (e^(E-Ef)kt + 1)



I know both are related to fermi-dirac statistics, which one is the appropraite one to use?
 
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Both distributions,

FD: p = 1 / (exp[(e - u)/kT] + 1)

and

BE: p = 1 / (exp[(e - u)/kT] - 1)

approach

MB: p = exp[(u - e)/kT]

at high temperatures (i.e. in classical limit).
So it depends on the temperature.
Does it answer your question? :)

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Last edited by a moderator:
uhh, I am afraid i don't get you =x
 
FD and BE differ by (+/-)1 factor.
This can be neglected if

exp(e - u) >> 1

which happens in classical regime,
that is at high temperatures
or at low concentrations.

You can try some rough values for semiconductors,
Setting zero at the top of valence band,

Eg ~ 1eV (energy gap)
Ef ~ 0.5eV (midway between val. and cond. band)

so E in cond. band is about 1eV

also kT ~ 0.025eV

so one gets

1/[exp(20) + 1] ~ 1/exp(20) = exp(-20)

since exp(20) is huge.

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Last edited by a moderator:

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