Phase Shifts and Interference in Reflection: Understanding the Differences

AI Thread Summary
The discussion centers on the phase shifts experienced by electromagnetic waves upon reflection, particularly in the context of thin film interference and Mach-Zehnder interferometers. It highlights that a π phase shift occurs with reflections from a medium with a higher refractive index, while in the Mach-Zehnder setup, reflections at beam splitters result in a π/2 phase shift. The contributor questions whether this discrepancy is due to the properties of beam splitters or the angles of incidence affecting the phase shifts. The complexities of these interactions suggest a nuanced understanding of how different optical components influence interference patterns. Overall, the conversation emphasizes the need to clarify the underlying principles governing phase shifts in various optical scenarios.
condorino
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Hi all!

I have a problem about the phase shift an e.m. wave acquire when, traveling through air, it's reflected back by a mirror (or a beam splitter) with n > n(air).

Now, I know the example of the thin film interference due to a π shift of the wave reflected by the medium.

But I see that in the Mach-Zender interferometer (for photons), when the two paths are different for the presence of two additonal reflections (on the beam splitters), we obtain a destructive interference (meaning a π phase shift). So it seems that each reflection on a beam splitter produces a π/2 phase shift, instead of a π phase shift.

So the thin film interference and the Mach-Zender interference have something different.

Now the question is:

Is that due to a feature (that I'm not able to find) of the beam splitters or is that a consequence of the different angle of incidence of light on the beam splitters (π/4 instead of π/2)??

Thx
 
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