Solid state-problem with difraction

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In summary: Miller's index and the atomic form factors fO and fH.As for the question of systematic extinction, it is possible if the sum of the phase factors for all the atoms in the unit cell is equal to zero. However, this will depend on the values of h, k, and l, as well as the atomic form factors. It is not possible to determine systematically whether or not there will be an extinction without knowing these values.To answer the second question, if fO=fH, then the expression for the structure factor will simplify to F=fO*(1+4expπ[h+k+l]). In this case, the sum of the phase factors will only be equal to zero if h+k
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Frank Einstein
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Homework Statement


Hi everybody. I am triying to do the next exercice:
Given a unit cell of Ice X and knowing the positions of the atoms on it, find the expression of the structure factor for a difraction peak as a function of its Miller's index and the atomic form factors fO and fH.

Will there be a systematic extinction?

Would there be more extinctions if fO=fH

Homework Equations


F=Σfi*erjHhkl

In the ice X, there are two atoms of oxygen (0,0,0) and (0.5, 0.5, 0.5); the atoms of hydrogen are at (1/4, 1/4, 1/4), (3/4, 3/4, 1/4), (3/4, 1/4, 3/4) and (1/4, 3/4, 3/4)

The Attempt at a Solution



F=fO*(1+expπ[h+k+l])+fH*(exp[(π/2)(h+k+l)]+exp[(π/2)(3h+3k+l)]+exp[(π/2)(3h+k+3l)]+exp[(π/2)(h+3k+3l)])

Here is where I don't know how to keep going; I have never seen something with two different atomic form factors.
In theory we have seen the case where only the firs term is; in that case, I would say h+k+l=2n+1 so that 1+expπ[h+k+l] becomes zero; but I don't know how to solve this with a second kind of atom.

Can anyone please help me?

Thanks for reading.
 
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  • #2

It seems like you are on the right track with your solution so far. Let's break down the problem and tackle it step by step.

First, we need to understand what the structure factor represents in this context. The structure factor is a measure of the interference between the wave scattered by the atoms in the unit cell and the incident X-ray beam. It is given by the sum of the atomic form factors (fi) multiplied by the phase factor (erjHhkl). The phase factor takes into account the positions of the atoms in the unit cell.

Now, for the ice X unit cell, we have two types of atoms - oxygen and hydrogen. Each atom has its own atomic form factor (fO and fH) and position in the unit cell (given by the indices h, k, and l). Therefore, the structure factor for a diffraction peak will be the sum of the contributions from both types of atoms.

To find the expression for the structure factor, we need to consider the positions of the atoms in the unit cell and how they contribute to the phase factor. For oxygen atoms, the contribution to the phase factor will be 1+expπ[h+k+l], as you have correctly identified. For hydrogen atoms, the contribution will be exp[(π/2)(h+k+l)], exp[(π/2)(3h+3k+l)], exp[(π/2)(3h+k+3l)], and exp[(π/2)(h+3k+3l)].

Now, to find the overall expression for the structure factor, we need to take into account the positions of all the atoms in the unit cell. This can be done by summing the contributions from each atom, as you have done in your attempt at the solution. However, there is one important factor that needs to be considered - the atomic form factors.

The atomic form factors represent the scattering strength of each atom, and they are dependent on the wavelength of the incident X-ray beam. In this case, we have two types of atoms with different form factors - fO and fH. This means that the overall structure factor will be a combination of these two form factors, weighted by the number of atoms of each type in the unit cell.

To find the expression for the structure factor, we need to multiply the contributions from each atom by its respective atomic form factor and then sum them all together. This will give us the final expression for the
 

Related to Solid state-problem with difraction

1. What is solid state and why is it important?

Solid state refers to the physical state of matter in which atoms or molecules are closely packed together and have a definite shape and volume. It is important because it is the state in which most materials exist and it plays a crucial role in many technological applications, such as in electronics and materials engineering.

2. What is the problem with diffraction in solid state materials?

The problem with diffraction in solid state materials is that the atomic arrangement of these materials is often highly complex and irregular, making it difficult to predict how the material will diffract light or other types of radiation. This can make it challenging to interpret diffraction patterns and understand the properties of the material.

3. How does diffraction help us understand solid state materials?

Diffraction is a powerful tool for studying solid state materials because it allows us to analyze the atomic and molecular structure of the material. By measuring the diffraction pattern, we can determine the spacing and arrangement of atoms or molecules in the material, which provides valuable insight into its properties and behavior.

4. What techniques are commonly used for diffraction in solid state materials?

The most commonly used techniques for diffraction in solid state materials are X-ray diffraction and electron diffraction. X-ray diffraction is used for crystalline materials, while electron diffraction is used for non-crystalline materials. Both techniques involve directing a beam of radiation at the material and analyzing the diffraction pattern that is produced.

5. How is the problem of diffraction in solid state materials being addressed?

Researchers are constantly developing new techniques and methods to overcome the problem of diffraction in solid state materials. This includes using more powerful radiation sources, such as synchrotron radiation, and developing sophisticated computational methods to analyze diffraction patterns. Additionally, advancements in materials engineering allow for the creation of more ordered and regular atomic structures, making diffraction analysis easier and more accurate.

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