By "simple" you mean homogeneous film, I guess...However, what if the film were not? Can you propose any supporting literature?
Thanks a lot for your replies
Suppose we realize a single thin film, then perfectly sandwich it between two sheet electrodes and measure the resistance. Would we expect the same value as with the sheet resistance ("horizontal" one)?
In optoelectronics and other nanotechnology applications (like organic photovoltaics, organic LEDs etc) most layers need to be electrically characterized among other types of measurements. Thus, sheet resistance is measured.
An example are the 4-point-probe resistivity measurements. Yet, what...
My sample is a thin film. I do not thing it has to do with electrolysis. I used 2 probes for the current and 2 other for voltage measurement. All of them on the periphery of the sample.
As ZnO is a semiconductor with a typical resistivity of ρ ~ 10^5 Ωcm, I tried to find the settling time during measurements.
If I impose a low-level constant current (as a source), I expect a transient phenomenon (of few tens of seconds) and then a constant state while measuring Voltage to...
Where can I find a set of equations that describe mathematically the resistance of various types of electrodes (e.g. hemispherical, conic, etc)?
Thank you in advance!