Bragg's diffraction x ray flourescence

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SUMMARY

This discussion centers on the relationship between Bragg's diffraction law and the production of characteristic X-rays in X-ray fluorescence. It establishes that while Bragg diffraction involves elastic scattering of photons, characteristic X-rays result from inelastic interactions where electrons transition to lower energy states. The discussion clarifies that characteristic X-rays are emitted isotropically, meaning their emission direction is independent of the incident angle, contrasting with the directional dependence of Bragg diffraction. The conversation also highlights the minimal impact of X-ray holography on characteristic radiation detection.

PREREQUISITES
  • Understanding of Bragg's Law in X-ray diffraction.
  • Knowledge of characteristic X-ray production mechanisms.
  • Familiarity with photon and electron interactions in X-ray fluorescence.
  • Basic principles of elastic vs. inelastic scattering.
NEXT STEPS
  • Explore the principles of X-ray fluorescence and its applications in material analysis.
  • Study the differences between elastic and inelastic scattering in X-ray physics.
  • Investigate the phenomenon of X-ray holography and its relevance in advanced imaging techniques.
  • Learn about the design and optimization of X-ray detectors for specific applications.
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Researchers in materials science, physicists studying X-ray interactions, and professionals involved in X-ray fluorescence analysis will benefit from this discussion.

quietrain
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i understand that when we shoot x-rays at a object, it will scatter in accordance to bragg's reflection law.

as such we position the detector as per the picture below

400px-Dmbraggreflection.jpg



my question is , for the production of characteristic x-rays, does bragg's reflection law still holds? and why does it hold?

because say, if i shoot from a 45 degrees angle, why do i have to put my detector at 90degrees in accordance to bragg's law.

since characteristic x-rays are due to the electron falling into a lower state, it is not the same incident x-ray, so why does it follows bragg's law, where i have to have my detector at twice the incident angle on the target?

thanks
 
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There are several differences between Bragg diffraction and production of characteristic radiation by fluorescence.

  • First, Bragg diffraction is photon-in photon-out. Characteristic radiation is electron-in photon-out. Try and calculate the wavelength of a 30 keV electron and compare to a 8.053 keV photon.
  • Bragg diffraction is elastic, the incident and scattered photons have the same energy.
  • Characteristic radiation is inelastic. The photon usually has a much lower energy than the electron. (for a Copper anode, you need 8.9 keV to knock out a K-shell electron, but only get 8.053 from the K-alpha radiation)

    http://en.wikipedia.org/wiki/K-alpha

There is an effect called X-ray holography that is due to diffraction by the photons of a characteristic line. But it is very weak and you have to work quite hard to see it.

http://en.wikipedia.org/wiki/X-ray_fluorescence_holography
 
hmm, i would be talking about the inelastic case then.

since it is inelastic, does it mean that if my photons come in at 45 incident angle, the characteristic x-rays will reflect at 45 degrees angle like in the first post's picture?

but it doesn't make sense to me? because it issn't like rolling a ball at 45 angle and letting it bounce off at 45.

for characteristic x-rays, it is a re-emission after the electron drops into a lower orbit, so why will it conserve the direction of momentum of the incident photon?

what determines the direction which the characteristic x-rays come out?
 
If you excite fluorescence with higher energy x-rays, the characteristic radiation will be emitted uniformly in all directions. It does not matter what the direction of the incident beam is. This is because the production of fluorescence is incoherent, and to the best of my knowledge it is incoherent because it is inelastic.

This is true in more than 99% of all cases. The remaining <1% are mostly covered by the x-ray holography effect, and the intensity may be affected by the x-ray standing wave effect.
 
if the characteristic x-rays come out at all directions, then why do i want my detector to be like the picture in the first post?

that would mean i am measuring the scattered x-rays from bragg's reflection right? and not the characteristic x-rays? if this is the case, then why does my spectrum only show characteristic peaks and very little background count?

in accordance to bragg's law, i should have a very constructive interference at that angles right? which means high background count? but why do i have to do that in this experiment since i only want the characteristic x-rays?

also, if i were to put at any other angle not satisfying bragg's law, then how will it change?
 

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