Determining the maximum number of minority electrons in semiconductor

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Homework Help Overview

The discussion revolves around determining the maximum number of minority electrons in a P-type silicon semiconductor, considering specific doping levels and physical dimensions of the device. The context includes concepts from semiconductor physics, particularly the behavior of charge carriers in doped materials.

Discussion Character

  • Conceptual clarification, Assumption checking

Approaches and Questions Raised

  • The original poster attempts to understand the derivation of the equation for minority carrier concentration, specifically how it relates to the Mass Action Law and the conditions of full acceptor ionization.
  • Some participants question the significance of thermal energy in creating holes at temperatures above absolute zero.

Discussion Status

Participants are exploring the relationship between minority and majority carriers through the Mass Action Law. There is a focus on clarifying the assumptions made regarding acceptor ionization and the implications of thermal energy on carrier concentrations. No consensus has been reached, but there is productive engagement on the underlying principles.

Contextual Notes

The discussion includes assumptions about full acceptor ionization and the conditions under which the equations apply, as well as the relevance of thermal effects on carrier generation.

Turion
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Homework Statement



P-type silicon can be doped in the range from 5x1014 cm-3 to 1020 cm-3. Determine the maximum possible number of minority electrons in a neutral P-type region if the device area is limited to AD = 1 cm x 1 cm and the thickness of the P-type region is limited to tP=100 μm. Assume room temperature and full acceptor ionization. ni = 1.02 x 1010 cm-3

Homework Equations


The Attempt at a Solution



Solution:

$$Maximum\quad concentration\quad of\quad minority\quad carriers\quad is\quad obtained\quad for\quad the\quad minimum\quad doping\quad level:\\ n=\frac { { { n }_{ i } }^{ 2 } }{ { N }_{ A } } =\frac { { (1.02*{ 10 }^{ 10 }) }^{ 2 } }{ 5*{ 10 }^{ 14 } } =2.1*{ 10 }^{ 11 }\quad { m }^{ -3 }\\ The\quad maximum\quad volume\quad is:\\ V={ A }_{ D }{ t }_{ p }={ (0.01) }^{ 2 }(100)({ 1 }0^{ -6 })={ 10 }^{ -8 }\quad { m }^{ 3 }\\ N=nV\\ =2.1*{ 10 }^{ 3 }$$

My confusion is how they got this equation:

$$n=\frac { { { n }_{ i } }^{ 2 } }{ { N }_{ A } }$$
 
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Turion said:
My confusion is how they got this equation:

$$n=\frac { { { n }_{ i } }^{ 2 } }{ { N }_{ A } }$$

It follows from the Mass Action Law n*p=ni2. As the acceptors are fully ionized, the concentration of the holes can be taken equal to NA. See:

http://en.wikipedia.org/wiki/Mass_action_law_(electronics)

ehild
 
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ehild said:
It follows from the Mass Action Law n*p=ni2. As the acceptors are fully ionized, the concentration of the holes can be taken equal to NA. See:

http://en.wikipedia.org/wiki/Mass_action_law_(electronics)

ehild

What about holes created because of thermal energy when temperature is larger than 0K?
 
Their number is usually negligible with respect to NA.

ehild
 

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