The index of refraction is basically due to the electrons of the medium. The electric field of the wave excites oscillations of the electrons, which in turn emit electromagnetic waves that overlap with the incident wave. The net effect is (a) a change in the velocity and (b) absorption. Both together can be described by a complex index of refraction
I am new to XPS Data analysis, and I have a .sle file that I got out of XPS Machine Software, and I am using CasaXPS to analyse the data. This software takes only .vms files. I want to convert the .sle to a .vms file for analysis. How or where can I do this? Any help on this will be deeply appreciated.