The piezoelectric scanner in a scanning tunneling microscope (STM) is utilized to precisely move the atomically sharp tip across the sample surface. It does not record the electric current tunneled by the tip; rather, it responds to electric currents to facilitate movement. This movement occurs over sample areas measuring hundreds of square nanometers, particularly in fine-scan schemes. Understanding this functionality is crucial for effective STM operation and imaging at the atomic level.
PREREQUISITESResearchers, physicists, and engineers involved in nanotechnology, materials science, and atomic-scale imaging techniques will benefit from this discussion.