Discussion Overview
The discussion revolves around a problem involving the destruction of an OpAmp (LM-324) in one electronics rack when sparks occur in a separate rack containing high voltage power supplies. Participants explore potential causes, including electromagnetic interference, ESD, and the specific characteristics of the OpAmp.
Discussion Character
- Exploratory
- Technical explanation
- Debate/contested
Main Points Raised
- One participant describes a situation where an OpAmp in a second rack is consistently destroyed when sparks occur in a first rack, which contains high voltage power supplies.
- Another participant suggests using transorbs at the input of the OpAmps as a protective measure, citing their experience with CE certification requirements.
- A different participant proposes that the issue may be related to RF susceptibility, questioning the level of EN 61000-4-3 testing the devices have undergone.
- Another participant expresses skepticism about RF radiation being the cause, arguing that it requires more power and suggesting that the OpAmp's BJT input could be susceptible to other forms of damage, such as current surges from connector contact bounce.
- One participant recounts a past experience where ICs were damaged due to momentary connector contact bounce, emphasizing that various factors could lead to IC failure.
- There is a suggestion that the problem could be resolved easily by implementing protective measures like transorbs, based on past experiences with similar issues.
Areas of Agreement / Disagreement
Participants express differing views on the cause of the OpAmp failure, with some attributing it to RF susceptibility and others to power surges or contact bounce. No consensus is reached regarding the primary cause of the problem.
Contextual Notes
Participants note the specific characteristics of the LM-324 OpAmp and the conditions under which it fails, but there are unresolved questions about the exact mechanisms leading to its destruction.