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How can we distinguish between Auger and core-level loss peaks (such as in XPS) in the secondary electron spectrum?
The discussion focuses on the distinctions between Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS), particularly in identifying core-level loss peaks within secondary electron spectra. Key points include the identification of true secondary electrons, Auger peaks, and elastic scattering peaks in the energy distribution. Participants seek clarity on exo electron spectroscopy, which involves the simultaneous heating and illumination of a sample, leading to the emission of exo electrons. Understanding these concepts is crucial for accurate interpretation of spectroscopic data.
PREREQUISITESMaterials scientists, spectroscopists, and researchers in surface analysis who aim to deepen their understanding of electron spectroscopy techniques and their applications in material characterization.