The difference between Auger Electron Spectroscopy and XPS.

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How can we distinguish between Auger and core-level loss peaks (such as in XPS) in the secondary electron spectrum?
 
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I looked into the "Encyclopedia of Materials Characterization" under Auger spectroscopy. It lists artifacts in the spectrum, but I am unsure when you say "core-level loss peaks" what is meant and would need to understand it.

The secondary electron (energy) distribution typically shows a broad peak at lower energies, known as "true secondaries" - e.g. a result of scattering and interactions while escaping the sample; then are the small Auger peaks, and to the right (high energies) is the elastic scattering peak of the incident electron beam.

Does this make sense?
 
Hi everyone,

Anyone with a clear view on exo electron spectroscopy?
I couldn’t find a well detailed article or a book in this topic anyone who could help me out with this?

As far I understood its a phenomena which happens when the sample is simultaneously heated and illuminated, emission of exo electron happens!
But what is the principle and how exactky it works and what is the role of this phenomenon on spectroscopy ?
Please help me out with this.

Thank you.