If you are referring to the multiple low energy ionization limits, they are due to the excitation of one electron to threshold, along with vibrational and/or rotational excitation of the resulting ion core.
#5
djelovin
28
0
In fact I was referring to doubly excited resonant states!
I am new to XPS Data analysis, and I have a .sle file that I got out of XPS Machine Software, and I am using CasaXPS to analyse the data. This software takes only .vms files. I want to convert the .sle to a .vms file for analysis. How or where can I do this? Any help on this will be deeply appreciated.