- #1
unscientific
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We know that silicon has a FCC lattice with basis at [0,0,0] and [1/4,1/4,1/4]. The structure factor is
[tex]S_{(hkl)} = \left[1 + e^{i\pi(h+k)} + e^{i\pi(l+k)} + e^{i\pi(h+l)} \right] \left[ 1+e^{i\frac{\pi}{2}(h+k+l)} \right][/tex]
which should be zero for (222) plane. But measuring it carefully reveals a non-zero intensity. Why is this the case?
[tex]S_{(hkl)} = \left[1 + e^{i\pi(h+k)} + e^{i\pi(l+k)} + e^{i\pi(h+l)} \right] \left[ 1+e^{i\frac{\pi}{2}(h+k+l)} \right][/tex]
which should be zero for (222) plane. But measuring it carefully reveals a non-zero intensity. Why is this the case?