Zapping a semiconductor with a laser

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    Laser Semiconductor
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Discussion Overview

The discussion revolves around the effects of laser excitation on n-type semiconductors, particularly focusing on the behavior of donor electrons when subjected to laser energy at the band gap. Participants explore the implications of low temperatures on electron occupation and the potential for donor electrons to be displaced from their impurity sites.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested

Main Points Raised

  • Some participants propose that when a n-type semiconductor is zapped with a laser at the band gap energy, donor electrons may be ripped from their impurity sites, especially if they are shallow enough.
  • Others suggest that the transitions should technically occur only at the energy of the laser, from the top of the valence band to the bottom of the conduction band.
  • A participant shares experimental results indicating that at room temperature, electrons at the Si 2p level moved approximately 1.2 eV when a CW dye laser was used, while simultaneously being measured by an XPS instrument.
  • There is a question regarding the significance of the 2p level in relation to the donor level, with some participants indicating that it does not contribute significantly but interacts through configuration interaction.
  • Clarifications are sought about the XPS instrument and the meaning of measuring the Si 2p signal, with one participant providing a brief explanation of the technique and its relevance to binding energy levels.

Areas of Agreement / Disagreement

Participants express differing views on the behavior of donor electrons under laser excitation, with no consensus reached on the exact mechanisms or implications of the observations discussed.

Contextual Notes

There are unresolved questions regarding the specific contributions of various electron levels to donor behavior and the interpretation of experimental results, as well as the dependence on temperature and laser energy.

BeauGeste
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If you zap a n-type semicond. with a laser with energy at, say, the band gap, what happens to the donor electrons? For sake of argument, let's say we're at low temp. where the occupation of electrons on donors is high. I know technically, you should only get transitions at the energy of the laser (top of vb to bottom of cb), but do you think that in reality the donor electrons (if shallow enough) would be ripped from their impurity sites? And then 'reattach' after a equilibrating time.
Does anyone know what happens?
 
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BeauGeste said:
If you zap a n-type semicond. with a laser with energy at, say, the band gap, what happens to the donor electrons? For sake of argument, let's say we're at low temp. where the occupation of electrons on donors is high. I know technically, you should only get transitions at the energy of the laser (top of vb to bottom of cb), but do you think that in reality the donor electrons (if shallow enough) would be ripped from their impurity sites? And then 'reattach' after a equilibrating time.
Does anyone know what happens?

Based on experimental results at RT with a CW dye laser at 600 nm (~1.5 eV) the electrons at the Si 2p level moved ~1.2 eV while the laser was turned on at the same time that an XPS instrument with its X-ray beam was measuring the Si 2p signal. GaAs responded similarly but with a lower shift.
 
Buckeye said:
Based on experimental results at RT with a CW dye laser at 600 nm (~1.5 eV) the electrons at the Si 2p level moved ~1.2 eV while the laser was turned on at the same time that an XPS instrument with its X-ray beam was measuring the Si 2p signal. GaAs responded similarly but with a lower shift.


The 2p level is the donor level? What is an XPS instrument and what does it mean to measure the Si 2p signal?
 
BeauGeste said:
The 2p level is the donor level? What is an XPS instrument and what does it mean to measure the Si 2p signal?

Based on current thinking the 2p does not contribute significantly to the donor level. But it does interact with the donor level and all other levels through "configuration interaction".

If you visit Wikipedia, you can find the XPS article that I am the main author of. It may help. The technique sends X-rays (1486 eV) into a sample. The X-rays interact with the atoms and electrons near the surface that have less than 1486 eV of binding energy will come out into the ultra-high vacuum of the instrument.

The Si 2p signal indicates that the 2p electrons have ~100 eV of binding energy. The Si 2s occurs at 150 eV. The Si 3s occurs at ~8 eV and the Si 3p occurs at ~3 eV. The 3s and 3p electron levels are the main contributors to the donor level. Then there are the free electrons etc.
 

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