Calculating LEED Spot Angles on Si(001) Surface with 100eV Electron Beam

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In summary, the conversation discusses the calculation of the angle from the surface normal to the (1, 0) and (1, 1) LEED spots on an unreconstructed Si(001) surface using an incident 100eV electron beam. The Si cubic lattice parameter is provided as 5.43072 angstroms. The equations used involve calculating the wavelength and wave vector of the electron beam, as well as using the Ewald sphere construction. The calculated angles to the (1, 0) and (1, 1) spots are 12.76° and 17.76°, respectively. However, there is some uncertainty about the method and answers.
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Homework Statement



A 100eV electron beam is normally incident on an unreconstructed Si(001) surface. Calculate the angle from the surface normal to the (1, 0) and (1, 1) LEED spots (the spots are indexed using the surface unit cell)

Si cubic latice parameter is 5.43072 angstroms



Homework Equations



Can calculate the wavelength in angstroms of the electron beam using [itex] λ = \frac{12.3}{√E} [/itex] where E is in eV. And hence wave vector [itex] k = \frac{2π}{λ} [/itex]



The Attempt at a Solution



I have used the Ewald sphere construction to calculate the angle, θ, to the (1, 0) LEED spot in terms of the wave vector, k , and the reciprocal lattice constant, b. [tex] b = \frac{2π}{5.43072} = 1.157 [/tex] [tex] k = \frac{2π}{1.23} = 5.108 [/tex]

Hence [itex] θ = arctan \frac{b}{k} = arctan \frac{1.157}{5.108} = 12.76°[/itex]

And then to the (1, 1) spot I used √2b instead of just b in the first part to find the angle = 17.76 degrees.

I'm very uncertain of my method and the answers. Are they correct? Thanks in advance
 
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Bump. Would this be better moved to a different board?
 

1. How do you calculate LEED spot angles on a Si(001) surface?

The LEED (Low Energy Electron Diffraction) technique uses a 100eV electron beam to measure the diffraction pattern of a crystal surface. To calculate the spot angles, you will need to know the momentum transfer vector, which can be determined by measuring the diffraction spots on the screen. The spot angles can then be calculated using the Bragg equation.

2. What is the purpose of calculating LEED spot angles on a Si(001) surface?

The purpose of calculating LEED spot angles is to determine the surface structure and symmetry of a crystal. By analyzing the diffraction pattern, we can gain insight into the arrangement of atoms on the surface and the orientation of the crystal lattice.

3. What factors can affect the accuracy of LEED spot angle calculations?

There are several factors that can affect the accuracy of LEED spot angle calculations, including the quality of the diffraction pattern, the stability of the electron beam, and the sample preparation. It is important to carefully control these variables in order to obtain accurate results.

4. Are there any limitations to using LEED spot angles for surface analysis?

While LEED is a powerful technique for surface analysis, there are some limitations to using spot angles for crystal structure determination. For example, LEED is not able to provide information about the chemical composition of the surface or the arrangement of atoms in the subsurface layers.

5. How can LEED spot angles be used in conjunction with other surface analysis techniques?

LEED spot angles are often used in conjunction with other surface analysis techniques, such as scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). By combining these techniques, researchers can obtain a more comprehensive understanding of the surface structure and composition of a material.

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