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Philip Koeck
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I'm looking for images of electron or ion beams recorded (from the side) using electrons, for example with a transmission electron microscope. Does anybody have references to publications?
One thing I want to know is how stable the electron or ion beam is while it's exposed to let's say 200 keV electrons..Scott said:I'm not sure what the point would be of such a measurement.
When I think of imaging with electrons, I think of electron microscopes - of which there are half a dozen basic types.
https://en.wikipedia.org/wiki/Electron_microscope
But in all cases, the object being scanned is held still in order to get a very high resolution image.
I'm thinking more along these lines: An electron or ion beam produces an electrostatic potential. In phase contrast electron microscopy and electron holography you can get images that are roughly proportional to the projected potential of the specimen. I'm wondering if anybody has imaged the potential produced by a charged particle beam using phase contrast electron microscopy or electron holography.mfb said:You have effects of beam-beam interactions in colliders.
Electrons are used to image electrons or ions through a process called electron microscopy. This involves using a beam of electrons to scan a sample, creating an image based on the interactions between the electrons and the sample's surface.
The purpose of using electrons to image electrons or ions is to obtain high-resolution images of these particles. This can provide valuable information about their structure, composition, and behavior, which can be used in various scientific fields such as materials science, biology, and nanotechnology.
Electrons interact with electrons or ions through various mechanisms, such as scattering and absorption. When the electron beam hits the sample, it can cause the particles to emit secondary electrons, which are then collected and used to create an image.
Yes, there are limitations to using electrons to image electrons or ions. One major limitation is the size of the sample that can be imaged, as electron microscopy is typically used for small-scale imaging. Additionally, the sample must be able to withstand the high vacuum environment required for electron microscopy.
Electron imaging technology has advanced significantly in recent years, with the development of new techniques such as scanning transmission electron microscopy (STEM) and cryo-electron microscopy. These advancements have allowed for even higher resolution imaging and the ability to study biological samples in their native state.