Discussion Overview
The discussion revolves around the use of metal masks for BOE (Buffered Oxide Etch) or HF (Hydrofluoric Acid) etching processes. Participants explore the effectiveness of different metals in preventing issues associated with photoresist peeling during etching.
Discussion Character
- Exploratory, Technical explanation, Debate/contested
Main Points Raised
- Some participants propose using metal masks instead of photoresist to avoid peeling issues during etching.
- Participants mention various metals such as Cr/Au, Al, and Ni as potential candidates for the mask, but there is uncertainty about which would yield the best results.
- One participant suggests that the peeling of photoresist may be due to underetching, as HF is an isotropic etchant that can etch underneath the resist.
- A document is referenced for additional tips on HF etching, although its content is not discussed in detail.
Areas of Agreement / Disagreement
Participants express differing opinions on the best metal to use for masks, and there is no consensus on the effectiveness of photoresist versus metal masks. The discussion remains unresolved regarding the optimal material choice.
Contextual Notes
There are limitations regarding the assumptions about the etching processes and the specific conditions under which different metals may perform better or worse. The discussion does not clarify the dependence on specific etching parameters or the context of use for each metal.