Bragg's diffraction x ray flourescence

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Discussion Overview

The discussion revolves around the relationship between Bragg's diffraction law and the production of characteristic X-rays in X-ray fluorescence. Participants explore the implications of incident angles, the nature of the emitted X-rays, and the conditions under which Bragg's law applies to characteristic radiation.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested

Main Points Raised

  • One participant questions whether Bragg's reflection law applies to characteristic X-rays, particularly in terms of detector positioning relative to the incident angle.
  • Another participant distinguishes between Bragg diffraction (photon-in photon-out) and characteristic radiation (electron-in photon-out), noting the differences in energy and elastic vs. inelastic interactions.
  • A participant suggests that characteristic X-rays, being a result of electron transitions, may not follow the same directional conservation as elastic scattering, raising questions about the emission direction of characteristic X-rays.
  • It is proposed that characteristic radiation is emitted uniformly in all directions due to its incoherent nature, which is a result of the inelastic process.
  • One participant expresses confusion about the purpose of detector positioning if characteristic X-rays are emitted isotropically, questioning the relationship between detected peaks and background counts in the spectrum.
  • Concerns are raised about the implications of measuring at angles that do not satisfy Bragg's law and how this might affect the observed results.

Areas of Agreement / Disagreement

Participants do not reach a consensus on the applicability of Bragg's law to characteristic X-rays, with multiple competing views on the nature of X-ray emission and detection remaining unresolved.

Contextual Notes

Participants highlight the complexities of inelastic scattering and the conditions under which Bragg's law may or may not apply, indicating a need for clarity on definitions and assumptions regarding the interactions involved.

Who May Find This Useful

This discussion may be of interest to those studying X-ray fluorescence, diffraction techniques, or the interactions of X-rays with matter in experimental physics.

quietrain
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i understand that when we shoot x-rays at a object, it will scatter in accordance to bragg's reflection law.

as such we position the detector as per the picture below

400px-Dmbraggreflection.jpg



my question is , for the production of characteristic x-rays, does bragg's reflection law still holds? and why does it hold?

because say, if i shoot from a 45 degrees angle, why do i have to put my detector at 90degrees in accordance to bragg's law.

since characteristic x-rays are due to the electron falling into a lower state, it is not the same incident x-ray, so why does it follows bragg's law, where i have to have my detector at twice the incident angle on the target?

thanks
 
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There are several differences between Bragg diffraction and production of characteristic radiation by fluorescence.

  • First, Bragg diffraction is photon-in photon-out. Characteristic radiation is electron-in photon-out. Try and calculate the wavelength of a 30 keV electron and compare to a 8.053 keV photon.
  • Bragg diffraction is elastic, the incident and scattered photons have the same energy.
  • Characteristic radiation is inelastic. The photon usually has a much lower energy than the electron. (for a Copper anode, you need 8.9 keV to knock out a K-shell electron, but only get 8.053 from the K-alpha radiation)

    http://en.wikipedia.org/wiki/K-alpha

There is an effect called X-ray holography that is due to diffraction by the photons of a characteristic line. But it is very weak and you have to work quite hard to see it.

http://en.wikipedia.org/wiki/X-ray_fluorescence_holography
 
hmm, i would be talking about the inelastic case then.

since it is inelastic, does it mean that if my photons come in at 45 incident angle, the characteristic x-rays will reflect at 45 degrees angle like in the first post's picture?

but it doesn't make sense to me? because it issn't like rolling a ball at 45 angle and letting it bounce off at 45.

for characteristic x-rays, it is a re-emission after the electron drops into a lower orbit, so why will it conserve the direction of momentum of the incident photon?

what determines the direction which the characteristic x-rays come out?
 
If you excite fluorescence with higher energy x-rays, the characteristic radiation will be emitted uniformly in all directions. It does not matter what the direction of the incident beam is. This is because the production of fluorescence is incoherent, and to the best of my knowledge it is incoherent because it is inelastic.

This is true in more than 99% of all cases. The remaining <1% are mostly covered by the x-ray holography effect, and the intensity may be affected by the x-ray standing wave effect.
 
if the characteristic x-rays come out at all directions, then why do i want my detector to be like the picture in the first post?

that would mean i am measuring the scattered x-rays from bragg's reflection right? and not the characteristic x-rays? if this is the case, then why does my spectrum only show characteristic peaks and very little background count?

in accordance to bragg's law, i should have a very constructive interference at that angles right? which means high background count? but why do i have to do that in this experiment since i only want the characteristic x-rays?

also, if i were to put at any other angle not satisfying bragg's law, then how will it change?
 

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