Coupling capacitance between interconnects in VLSI

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Discussion Overview

The discussion focuses on the measurement and modification of coupling capacitance between interconnects in VLSI circuits, particularly through the manipulation of the dielectric constant of silicon dioxide. Participants explore various methods to achieve this, including doping and the effects of frequency on capacitance.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested

Main Points Raised

  • One participant seeks to measure the effect of added charges in silicon dioxide on coupling capacitance at a frequency of 500 MHz, questioning the relationship between dielectric constant and charge concentration.
  • Another participant inquires about artificially increasing the dielectric constant of silicon dioxide.
  • Some participants mention the concept of Electrically Controlled Capacitance and its relation to varying capacitance through reverse bias voltage across semiconductor junctions.
  • There is a suggestion that doping silicon dioxide could modify its dielectric properties, with a request for governing equations.
  • Some participants reference high-k and low-k dielectrics as potentially relevant resources.
  • One participant expresses skepticism about the impact of doping on dielectric constant, suggesting it may primarily affect conductance.
  • Another participant notes that doping silicon dioxide with fluorine can lower its dielectric constant, which would reduce capacitive coupling, while the original poster aims to increase coupling.
  • A suggestion is made to explore hafnium-based high-k dielectrics and oxynitride as alternatives, though processing techniques are noted to be complex.

Areas of Agreement / Disagreement

Participants express a range of views on the effects of doping on dielectric properties, with some suggesting it may lower the dielectric constant while others seek methods to increase it. The discussion remains unresolved regarding the best approach to achieve the desired modifications in capacitance.

Contextual Notes

Participants acknowledge the complexity of modifying dielectric properties and the potential trade-offs involved, such as conductance and leakage in capacitors. Specific equations governing the relationship between doping and dielectric constant remain unspecified.

omar alaa
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Hello all,

I'm trying to measure the effect of adding charges in the silicon dioxide separating two interconnects in VLSI circuits and how it will effect the coupling capacitance between these two wires. How can I measure this effect ? The VLSI circuit I'm working on has frequency of 500 Mhz.

What I did so far is playing a little with FastFieldSolver tool and see the effect of changing the dielectric constant on the coupling capacitance between two wires...but still I don't know how the dielectric constant is related to charge (impurities) concentration in the silicon dioxide.

My goal is to be able to tune the dielectric constant of the silicon dioxide by adding charges (impurities) in the silicon dioxide ...and how to count the effect of operating frequency in my calculations.

Thanks
 
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Is there a way to increase artificially the dielectric constant of a material (i.e. silicon dioxide) ?
 
omar alaa said:
Is there a way to increase artificially the dielectric constant of a material (i.e. silicon dioxide) ?
Are you familiar with Electrically Controlled Capacitance?

https://en.wikipedia.org/wiki/Variable_capacitor

I don't know if it might be related to what you are asking... By varying the reverse bias voltage across a semiconductor junction, you change the width of the depletion layer, which changes the capacitance across the junction. The technique is commonly used in radio circuits and other circuits that need a variable capacitance for tuning purposes.
 
berkeman said:
Are you familiar with Electrically Controlled Capacitance?

https://en.wikipedia.org/wiki/Variable_capacitor

I don't know if it might be related to what you are asking... By varying the reverse bias voltage across a semiconductor junction, you change the width of the depletion layer, which changes the capacitance across the junction. The technique is commonly used in radio circuits and other circuits that need a variable capacitance for tuning purposes.

No I'm not talking about dielectric in transistors (sorry for not clarifying), I'm talking about parallel plate capacitor. I want to increase its capacitance, but I don't have control over goemetries..I can just modify the dielectric. I was wondering if I can increase the dielectric constant with doping of ions or free charges, if yes is there an equation governing this ?
 
The Wikipedia articles on high-k and low-k dielectric may help.
 
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Fred Wright said:
The Wikipedia articles on high-k and low-k dielectric may help.
Is there a way to modify the silicon dioxide itself such as doping the dielectric ?
 
omar alaa said:
Is there a way to modify the silicon dioxide itself such as doping the dielectric ?
I would think that would mostly alter the conductance, not the dielectric constant. How leaky can this capacitor be? Leaky capacitance is usually a bad thing, no?
 
You can lower the dielectric constant of your SiO2 substrate by doping it with fluorine. This is done with plasma enhanced CVD. Lowering the dielectric constant will reduce the capacitive coupling between your traces. If you want to measure the result, hook your circuit to a network analyzer.
 
Fred Wright said:
You can lower the dielectric constant of your SiO2 substrate by doping it with fluorine. This is done with plasma enhanced CVD. Lowering the dielectric constant will reduce the capacitive coupling between your traces. If you want to measure the result, hook your circuit to a network analyzer.
Actually I want to do the opposite. I want to increase the capacitive coupling
 
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I suggest you do a literature search on hafnium based high-k dielectrics. I am not familiar with the processing techniques involved but I suspect that it isn't trivial. Also, industry has used oxynitride, where a small amount of nitrogen is infused into the SiO2 substrate.
 

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