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Determining the behaviour of a wafer from the CV curves

  1. Mar 23, 2009 #1
    After conducting CV measurements on Thin Film semiconductor wafers, how do we determine the behavior of the wafer based on the measurements? I have a sample of the reading obtained. I would be glad if anyone can help me.
     

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  2. jcsd
  3. Mar 23, 2009 #2

    berkeman

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    Staff: Mentor

    Welcome to the PF. You should post a PDF file instead of a ZIP file. Less likely to have virus problems that way.
     
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