Does anyone have experience with DBWS software for Rietveld refinement?

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SUMMARY

The discussion centers on the use of DBWS software for Rietveld refinement in analyzing X-ray diffraction (XRD) data from a FeSeTe sample. The initial challenge involved matching calculated intensities with observed ones, which was later identified as an issue with asymmetry in intensity peaks rather than the software itself. The user has since shifted to employing the split Pearson VII function for data refinement, resulting in improved outcomes.

PREREQUISITES
  • Understanding of Rietveld refinement techniques
  • Familiarity with X-ray diffraction (XRD) data analysis
  • Knowledge of the split Pearson VII function for peak fitting
  • Experience with DBWS software for crystallographic analysis
NEXT STEPS
  • Research advanced techniques in Rietveld refinement using DBWS software
  • Explore the application of split Pearson VII for peak asymmetry correction
  • Learn about alternative software options for XRD data analysis
  • Investigate methods for improving intensity matching in crystallographic studies
USEFUL FOR

Researchers and analysts in materials science, particularly those working with X-ray diffraction data and Rietveld refinement techniques.

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I'm analyzing data from XRD on a FeSeTe sample, and can't figure out how to match the calculated intensities with the observed ones.

I'm having a hard time with this program, can someone help me?
 
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Thanks for the post! Sorry you aren't generating responses at the moment. Do you have any further information, come to any new conclusions or is it possible to reword the post?
 
Greg Bernhardt said:
Thanks for the post! Sorry you aren't generating responses at the moment. Do you have any further information, come to any new conclusions or is it possible to reword the post?

Yes, I discovered that my problem is not with the software, but with the assymetry in the intensities peaks. I'm trying to use split Pearson VII to refine my data now and I'm getting good results.
 

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