Doping with impurities does what to Silicon?

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Discussion Overview

The discussion centers on the effects of doping silicon with impurities, specifically focusing on the behavior of silicon atoms and dopant atoms within the crystal lattice. Participants explore the implications of doping on the material's properties, including conductivity and structural integrity, as well as the processes involved in introducing dopants into silicon.

Discussion Character

  • Technical explanation
  • Conceptual clarification
  • Debate/contested

Main Points Raised

  • One participant inquires about the fate of silicon atoms when impurities are added, questioning whether silicon atoms are replaced or altered in the lattice.
  • Another participant suggests that silicon atoms remain in the lattice, with the lattice spacing adjusting slightly if doping levels are low, while high doping levels may lead to lattice defects.
  • A different viewpoint asserts that neither silicon nor dopant atoms can move freely within the lattice, indicating that they contribute to lattice imperfections.
  • It is proposed that the introduction of dopants changes the conductivity of silicon, making it either N-type or P-type, which affects charge carriers in the material.
  • One participant explains the ion implantation process used to introduce dopants, noting that many dopant atoms initially occupy interstitial sites and require annealing to become electrically active.
  • There is mention of the movement of silicon atoms during the annealing process, which helps repair lattice defects and allows dopants to migrate to lattice sites.
  • Concerns are raised about the potential for excessive strain in the lattice when a large number of dopant atoms are present, leading to defects.

Areas of Agreement / Disagreement

Participants express differing views on the movement and role of silicon and dopant atoms in the lattice, with some asserting that atoms remain fixed while others discuss their potential mobility under certain conditions. The discussion does not reach a consensus on these points.

Contextual Notes

Limitations include the dependence on doping levels, the specific methods of doping, and the conditions under which silicon atoms and dopants interact within the lattice. The discussion reflects varying interpretations of these processes.

physics.cie
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I want to know ... what happens to silicon when some impurity is added to it.
Where does silicon goes??
 
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When we doped phosphorus in site of silicon then some silicon is replaced and phosphorus is added to the site . Now I am asking for that silicon atom ??
 
Any one here to reply
 
They don't go anywhere, but remain in the lattice. If the doping level is small, the extra silicon atoms just get absorbed by the lattice spacing getting slightly smaller. If the doping level is large, there are typically lattice defects that absorb the extra atoms. For this reason, heavily doped junctions are always leakier than lightly doped junctions.
 
U mean that silicon atom is now free to move in the lattice? ?
 
No, neither the silicon atoms, nor the dopant atoms can move ... they simply make the crystal lattice "imperfect". I suppose an atom may move back and forth between two sites, especially with changes in temperature, but this is more a behavior of surface atoms which are weakly bound.

The effect of the dopant is to change the conductivity of the silicon; it also makes it N or P type: a donor of negative (electrons) or positive (holes) charges ... as with the NP diode.

In other words, it is a method of engineering the properties of the material: the dopant and the density both change the properties.
 
physics.cie said:
U mean that silicon atom is now free to move in the lattice? ?

The usual method to introduce impurities in silicon processing is with ion implantation, where the dopant atoms are shot into the silicon crystal at high energies. If you just do the ion implantation and look at the electrical properties, most of the dopant atoms are not electrically active, since they are sitting at interstitial sites (between the silicon atoms) instead of at lattice sites. For this reason, one always follows an ion implantation with some sort of high temperature anneal, typically at least 600C. During the anneal, the dopant atoms have enough energy to move about in the lattice, and they migrate from interstitial sites to lattice sites. They then become electrically active. There is also some movement of the silicon atoms during this anneal, and lattice defects created by the ion implantation process are generally repaired, since the uniform lattice is a lower energy state. The extra atoms are taken up in the lattice by just a slight change in the lattice spacing, as I said earlier, which introduces some lattice strain. However, if there are a large number of dopant atoms, the strain gets to be too large for the lattice to sustain, and defects appear.
 

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