How does atomic force microscope create tunnelling?

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Discussion Overview

The discussion revolves around the mechanisms of atomic force microscopes (AFM) and their relation to tunneling phenomena, particularly in the context of scanning tunneling microscopes (STM). Participants explore the operational principles of these microscopy techniques and clarify their distinctions.

Discussion Character

  • Technical explanation
  • Debate/contested

Main Points Raised

  • One participant requests clarification on how tunneling occurs in atomic force microscopes, referencing an external article.
  • Another participant explains that AFMs utilize van der Waals forces and do not make contact with the surface, while STMs involve tunneling due to a bias applied between the tip and the sample surface.
  • A different participant asserts that AFMs are not related to tunneling in this context, suggesting that AFMs are used to arrange atoms for tunneling to occur in a quantum corral, which is relevant to the article mentioned.
  • One participant notes that AFM systems can sometimes be converted into STM systems with minor adjustments, emphasizing that STM relies on tunneling while AFM does not.

Areas of Agreement / Disagreement

Participants express differing views on the role of AFM in tunneling phenomena, with some asserting that AFM does not involve tunneling while others suggest a connection through the conversion to STM. The discussion remains unresolved regarding the relationship between AFM and tunneling.

Contextual Notes

There are limitations in the discussion regarding the definitions and operational principles of AFM and STM, as well as the conditions under which tunneling may or may not be relevant.

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As I understand, the way Atomic Force Microscopes (AFM) work is by taking advantage of the van der Waals force between the tip and the surface. It is important to note that the tip does not actually touch the surface of the sample: leaving a very small space in between them.

In Scanning Tunnelling Microscope (STM), a bias is placed between the tip and the sample surface. For this example, let's place a positive bias on the tip, and negative bias on the surface. Since the gap between them is very small, there is a possibility where the electron from the surface of a conducting sample can tunnel through the thin layer of air to the tip of the microscope.

This case is similar to electron tunnelling through a thin potential barrier in quantum mechanics.
 
The AFM has nothing to do with tunneling in this context. AFM is just used to place atoms on the surface in the arrangement that's needed. Probably a quantum corral, or something similar. The electron can tunnel into and out of the corral, which can control the current, making a 1-electron transistor that the article talks about.

The STM, which maxxlr8 mentions, is a completely different type of scanning microscope, which does, in fact, make use of tunneling current. But it has nothing to do with this article.
 
The confusing comes in because in some system, the AFM system can be converted into a STM system with minor adjustments (sometime, just by the electronics).

STM system uses the principle of tunneling, where the vacuum is the potential barrier. AFM system does not make use of tunneling, as has been explained in this thread.

Zz.
 

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