SUMMARY
The discussion clarifies the operational principles of Atomic Force Microscopes (AFM) and Scanning Tunneling Microscopes (STM). AFM utilizes van der Waals forces without direct contact between the tip and the sample surface, while STM employs tunneling current facilitated by a bias between the tip and the conducting sample. The electron tunneling phenomenon is a quantum mechanics principle that allows electrons to traverse a thin potential barrier. It is emphasized that AFM does not involve tunneling, although it can be adapted into an STM with minor electronic modifications.
PREREQUISITES
- Understanding of Atomic Force Microscopes (AFM) and their operational principles
- Knowledge of Scanning Tunneling Microscopes (STM) and tunneling current
- Familiarity with quantum mechanics concepts, particularly electron tunneling
- Basic knowledge of van der Waals forces and their applications in microscopy
NEXT STEPS
- Research the differences between Atomic Force Microscopes (AFM) and Scanning Tunneling Microscopes (STM)
- Study the principles of electron tunneling in quantum mechanics
- Explore the applications of quantum corrals in nanotechnology
- Learn about the modifications required to convert an AFM into an STM system
USEFUL FOR
Researchers, physicists, and engineers interested in nanotechnology, microscopy techniques, and quantum mechanics applications will benefit from this discussion.