Scanning Electron Microscopy of Graphene

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Discussion Overview

The discussion revolves around the characterization of graphene produced via chemical vapor deposition (CVD) on copper, specifically focusing on the use of scanning electron microscopy (SEM) to determine whether the graphene is monolayer. Participants explore the capabilities and limitations of SEM in this context, as well as alternative methods for confirming the number of graphene layers.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested

Main Points Raised

  • One participant reports observing what they believe to be monolayer graphene under SEM, noting specific growth patterns and contrast that suggest a single layer.
  • Another participant suggests using energy-dispersive X-ray spectroscopy (EDS) to differentiate between graphene and copper, proposing that the intensity of the copper signal could help estimate the graphene thickness.
  • A different participant expresses skepticism about determining the number of graphene layers solely from SEM images, stating that Raman spectroscopy is needed for certainty.
  • The original poster acknowledges the limitations of SEM for layer determination and expresses interest in using electron diffraction and EDS for further analysis, while also noting the need for training in these techniques.
  • There is a consensus that Raman spectroscopy is regarded as a reliable method for determining the number of graphene layers, although the original poster has not yet received training in this area.

Areas of Agreement / Disagreement

Participants generally agree that while SEM can provide some insights, it is not definitive for determining the number of graphene layers. Multiple competing views exist regarding the best methods for confirming monolayer status, particularly the reliance on Raman spectroscopy versus EDS and electron diffraction.

Contextual Notes

Participants mention the need for training in various techniques, indicating that some methods discussed may not be accessible to all contributors at this time. There is also an acknowledgment of the potential unreliability of using SEM contrast alone for layer determination.

stefan741
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Hi Everyone,

I have recently made some graphene on copper via a chemical vapour deposition process. I have also managed to have a peep under an SEM at this. I do see what I believe to be monolayer graphene. I am very sure the contrast I see is graphene due to the growth patterns, ranging from hexagonal to star shaped, very commonly reported in literature. The contrast I see (between Cu and graphene) is simply one shade, and does not show any layering (if you imagine different contrasts for more or less layers) which could indicate several layers. I do expect monolayer graphene simply from the nature of CVD of graphene on Copper but really would like to understand this further. I have attached an image for you to see.

The questions I have are:

Under an SEM is it possible to tell if you have monolayer graphene? And if yes, how?

Using an SEM what is the smallest separation between two objects that can be resolved with secondary electrons?

I'm very new to SEM and any help or guidance with these questions will be greatly appreciated. THANKS!
 

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Did you use EDS to determine which was the graphene and which was the Cu?

When you look at the graphene's EDS, do you also see signatures of Cu? If you do, then maybe one can estimate the thickness of the graphene's layer from the intensity of the Cu signal (when compared to the bare Cu). That should tell you if you have only a monolayer of graphene or not.

Zz.
 
stefan741 said:
Under an SEM is it possible to tell if you have monolayer graphene? And if yes, how?

I doubt it. AFAIK you need to use Raman to be 100% sure. There are also various SPM technques (Kelvin etc) that give you contrast between one and two layers.
 
Thanks for your responses, I really appreciate them :)

I have been very sceptical that it was possible to determine number of layers of graphene by simply looking at picture contrast from the SEM and believe that even if it is possible it is more than likely very unreliable, however I thought I would ask just in case somebody came up with a fantastic answer here.

Zapperz I think this may be a solution for me as from what I understand it is possible to determine the graphene thickness using electron diffraction form the ratio of intensities from the graphene and underlying substrate. I just have not used diffraction methods before and will need to be trained. But this will be good for me as I should be able to get an image of the sample and determine it's thickness with EDS both using the SEM I believe.

f95toli from what I understand Raman is the best technique to determine number of graphene layers, however unfortunately I still need training in Raman spectroscopy.

Thanks again for your answers.
 

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