Temperature coefficient of resistance - size effects vs bulk

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SUMMARY

The discussion centers on the temperature coefficient of resistivity (alpha) and its dependence on resistor size, particularly as dimensions shrink to tens of nanometers. It is established that alpha is a material constant for bulk-type resistors and is generally independent of dimensions. However, literature suggests that alpha may exhibit some dependence on physical dimensions, particularly in thin films, where surface roughness plays a significant role. The Fuchs-Sondheimer theory is mentioned, although it does not directly address alpha.

PREREQUISITES
  • Understanding of temperature coefficient of resistivity (alpha)
  • Familiarity with the linear resistance equation R=R0*(1+alpha*(T-T0))
  • Knowledge of thin film physics and surface roughness effects
  • Basic grasp of electron scattering and phonon localization concepts
NEXT STEPS
  • Research the Fuchs-Sondheimer theory and its implications on resistivity
  • Explore the effects of surface roughness on resistivity in thin films
  • Investigate the relationship between surface:volume ratio and temperature coefficient of resistivity
  • Review literature on electron scattering and phonon localization in nanoscale materials
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Researchers in materials science, electrical engineers, and physicists interested in the effects of size on resistivity and temperature coefficients in nanoscale resistors.

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I am looking for a reference to discuss the effects of resistor size on alpha, the temperature coefficient of resistivity.
If we use the linear R=R0*(1+alpha*(T-T0))
alpha is a material constant, presumably for bulk-type resistors. Will alpha change as size (cross sectional area) of the resistor shrinks to tens of nanometers in one dimension? any reference on this? thanks
 
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Alpha is a material constant that is independent of the dimensions.
 
Baluncore said:
Alpha is a material constant that is independent of the dimensions.

I concluded something different, based on literature.

http://iopscience.iop.org/1347-4065/9/11/1326there is also the fuchs-sondheimer theory but i don't think it dicusses alpha
 
I cannot access that article because it is behind a pay-wall.

The abstract refers to resistivity as being determined by surface roughness in thin films. I would interpret that as a “virtual thickness” parameter, not as a change in the bulk material resistivity.

Although the abstract mentions the temp-co was also studied, it reveals no temp-co effect due to thickness. That might suggest that there was no significant effect on alpha observed.
 
I can't attest to the quality of the article but it has the suggestion that alpha may have some dependence on the physical dimensions of the sample.

I think a difference in the effect of surfaces and grains on the scattering of electrons and scattering or localization of phonons could conceivably contribute to changes in alpha as a function of surface:volume ratio or some other size parameter.

for completeness, from the article
Here h is the amplitude of oscilations describing the surface roughness and lambda is the mean-free-path of electrons.
Alpha-thickness.png

definition%20of%20h.png

if you are really interested in the article let me know and i can send you a dropbox link or something
 

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