SUMMARY
The intrinsic carrier concentration Ni for silicon can be calculated using the equation ni^2 = Nc*Nv exp(-Eg/kT), where Eg is the energy band gap. The energy band gap Eg for silicon is approximately 1.1-1.2 eV and has a weak temperature dependence, with values of Eg(0K) = 1.17 eV and Eg(300K) = 1.12 eV as per Ashcroft and Mermin. To model the temperature dependence of the band gap, the empirical relationship Eg(T) = Eg(0) - alpha*T^2/(T + beta) is used, with constants alpha = 4.730X10^(-4) eV/K and beta = 636 K provided by Pierret in "Advanced Semiconductor Fundamentals".
PREREQUISITES
- Understanding of semiconductor physics
- Familiarity with the concepts of effective density of states (Nc and Nv)
- Knowledge of the Arrhenius equation and its application
- Basic understanding of empirical modeling techniques
NEXT STEPS
- Research the calculation of intrinsic carrier concentration in other semiconductors
- Study the optical properties of semiconductors and their relation to band gap energy
- Explore the empirical relationships for band gap temperature dependence in various materials
- Learn about the experimental methods for measuring band gap energy
USEFUL FOR
Researchers, physicists, and engineers working in semiconductor technology, particularly those focused on the thermal properties and electronic characteristics of silicon.