What are the Differences Between Transmission and Scanning Electron Microscopes?

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SUMMARY

The discussion clarifies the differences between Transmission Electron Microscopes (TEM) and Scanning Electron Microscopes (SEM). TEM, the original form of electron microscopy, offers superior resolution compared to SEM, which detects backscattered and secondary electrons. Sample preparation for TEM is complex, requiring extremely thin samples, while SEM allows for quicker and simpler preparation. The introduction of Scanning TEM (STEM) has addressed some limitations of traditional TEM by incorporating rastering capabilities, balancing resolution with areal coverage.

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  • Understanding of electron microscopy principles
  • Familiarity with sample preparation techniques for electron microscopy
  • Knowledge of electron detection methods in microscopy
  • Basic concepts of quantum tunneling in electron behavior
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  • Research the principles of Transmission Electron Microscopy (TEM)
  • Learn about Scanning Electron Microscopy (SEM) and its applications
  • Explore sample preparation techniques for TEM and SEM
  • Investigate the advancements in Scanning Transmission Electron Microscopy (STEM)
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Researchers, materials scientists, and microscopy technicians seeking to deepen their understanding of electron microscopy techniques and their applications in various fields.

kevin86
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Is transmission electron microscope the original EM, and Scanning the better resolution one. What is the main difference between the two
 
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They both use electrons.
Other than that, I can't think of anything that's the same.
I suppose you could say Scanning uses quantum tunneling electrons while the TM uses clasical electrons.
 
kevin86 said:
Is transmission electron microscope the original EM, and Scanning the better resolution one. What is the main difference between the two
TEM was the first form of electron microscopy (the invention won Ruska his Nobel Prize). It also has a better resolution than SEM.

The main difference between the two is what gets detected. In SEM, you detect backscattered and secondary electrons (these are electrons emitted due to collisions from the impinging beam and other secondary phenomena), while in TEM you directly detect the transmitted electrons. Consequently, it requires a very different sample preparation for the two techniques. Notably, TEM samples need to be extremely carefully thinned to ensure a reasonable signal to noise ratio. Sample preparation is relatively, a walk in the park for SEM samples. Also, with the SEM, you can raster the e-beam across the area of the sample and (reasonably quickly) collect surface information about a fairly large area. The inability to do this with the traditional TEM was overcome somewhat by incorporating a rastering capability into what then became the STEM (Scanning TEM). Naturally, there's a trade off between resolution, and areal coverage.

NoTime said:
I suppose you could say Scanning uses quantum tunneling electrons while the TM uses clasical electrons.
That's STM you have in mind, not SEM.
 

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