Why Does the RMS Value Represent Noise in a Photoconductor Signal?

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Discussion Overview

The discussion centers around the relationship between the root mean square (RMS) value of electrons collected in a photoconductor signal and the concept of noise within that signal. Participants explore the definition of noise, the appropriateness of using RMS as a measure, and the implications of noise characteristics in different applications.

Discussion Character

  • Exploratory
  • Technical explanation
  • Conceptual clarification

Main Points Raised

  • One participant expresses confusion about why the RMS value relates to noise in a photoconductor signal.
  • Another participant asserts that the RMS value is a standard definition of noise, indicating that more electrons without a corresponding signal contribute to increased noise.
  • A later reply provides a detailed explanation of RMS, suggesting it averages out random variations in noise to provide a more stable measure, but notes that this may not always be representative due to the nature of noise in different applications.
  • Concerns are raised about the potential for RMS to give an overly optimistic assessment of noise, especially in cases where noise exhibits high peaks or is not Gaussian in nature.
  • It is mentioned that weighted noise measurements, which involve filtering the noise signal before calculating RMS, are often used to account for specific characteristics of the noise relevant to the application.

Areas of Agreement / Disagreement

Participants do not reach a consensus on the appropriateness of using RMS as a measure of noise, with some supporting its use while others highlight its limitations and the variability of noise characteristics in different contexts.

Contextual Notes

Participants note that the effectiveness of RMS as a noise measure may depend on the assumptions about the nature of the noise (e.g., Gaussian) and the specific application, indicating that a simple RMS measurement may not capture all relevant aspects of noise.

CassiopeiaA
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I am confused about very fundamental question.

Why does the rms value of number of electrons collected from a signal(like in photoconductor) gives you the noise in that signal.
 
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That is the definition of noise.

More electrons without signal -> more noise. rms is chosen because it is a nice quantity to look at.
 
CassiopeiaA said:
I am confused about very fundamental question.

Why does the rms value of number of electrons collected from a signal(like in photoconductor) gives you the noise in that signal.

To get a good idea of the 'amount' of Noise entering a system, you can't look at the 'peak' value because, in the short term, it could vary a lot. Doing an RMS calculation is effectively looking at the power arriving (V2/R) at every instant and adding it up over a relatively short period of time. RMS is an attempt to replace the randomly varying noise with one equivalent (average) voltage. It's the most basic measure of noise and assumes that the noise is of a Gaussian nature.
The actual effect of random variations in a signal (noise) is different from application to application and a simple RMS measurement may not be representative. It is common to use a 'weighted' noise measurement, where the noise signal is passed through a filter before the RMS value is calculated so that, for instance, the frequency sensitivity curve of the ear is included in audio noise measurement.
In the case of a photo detector, you can get a very 'grainy' sort of noise with very high peaks. RMS will iron these out and may give a far too optimistic assessment.
 

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