- #1
Yinxiao Li
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We have a Renishaw inVia confocal Raman microscope. Currently I am using it to study photoluminescence. I have a very thin film with certain thickness (e.g. 60nm and 120nm). It turns out that they (60nm and 120nm) have different emission spectra. Here comes the question:
Can I divide the absolute intensity of each emission peak by the film thickness to compare the quantum yield of these two films? This is quite intuitive but I guess it may not be correct. But why?
Can I divide the absolute intensity of each emission peak by the film thickness to compare the quantum yield of these two films? This is quite intuitive but I guess it may not be correct. But why?