About X-ray Photoelectron Spectroscopy

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SUMMARY

The discussion focuses on the challenges of creating peak models for X-ray Photoelectron Spectroscopy (XPS) spectra, specifically regarding the full width at half maximum (FWHM) values for oxidized carbon (C) and phosphorus (P) species. The user reports achieving low residual standard deviation values but questions the validity of FWHM values reaching 2.3 eV. The conversation suggests that high FWHM values may be influenced by factors such as X-ray damage or modeling inaccuracies, while also questioning the acceptability of a 2.4 eV FWHM in high-resolution scans.

PREREQUISITES
  • Understanding of X-ray Photoelectron Spectroscopy (XPS)
  • Knowledge of peak modeling techniques in spectroscopy
  • Familiarity with residual standard deviation in data fitting
  • Basic chemistry knowledge related to oxidized species
NEXT STEPS
  • Research X-ray damage effects on XPS spectra
  • Explore advanced peak fitting techniques for XPS data
  • Learn about acceptable FWHM values for various elements in XPS
  • Investigate the impact of sample preparation on XPS results
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Researchers and analysts in materials science, chemists working with surface analysis, and anyone involved in interpreting X-ray Photoelectron Spectroscopy data.

Dan Zar
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Hello,
I am trying to create peak models for some XPS spectra. I have a decent intuition of the chemistry of the samples, and I obtain really good residual standard deviation values for the modeled data; however, some of the FWHM of the modeled oxidized species (C and P) on the narrow scans are as high as 2.3 eV. Is this due to X-ray damage? or maybe wrong modeling? or is a FWHM of 2.4 eV OK for C and/or P high resolution narrow scans. I am not an expert so please answer kindly. Thanks a lot!
 
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