SUMMARY
The forum discussion centers on the unexpected variations in emission spectra observed when using different objective lenses (20X, 50X, 100X) with a Renishaw inVia confocal microscope, specifically at an excitation wavelength of 532nm. Users noted that the emission spectra for plain silicon were consistent across objectives but differed significantly in peak intensity and position. Key factors contributing to these differences include the spectral transmission properties of the lenses and the potential impact of coverslip thickness on optical performance. The objective lenses in question are LEICA 566066 N PLAN EPI 20X/0.4, LEICA 566072 N PLAN EPI 50X/0.75, and LEICA 566073 N PLAN EPI 100X/0.85.
PREREQUISITES
- Understanding of confocal microscopy principles
- Familiarity with emission spectroscopy and Raman scattering
- Knowledge of optical elements, including objective lenses and coverslips
- Basic grasp of numerical aperture and its implications in microscopy
NEXT STEPS
- Investigate the spectral transmission curves for LEICA objective lenses
- Research the effects of coverslip thickness on optical performance in microscopy
- Explore the impact of numerical aperture on emission spectra in Raman microscopy
- Learn about the design considerations for objective lenses used in far-red applications
USEFUL FOR
Microscopists, spectroscopists, and researchers involved in material characterization using Raman spectroscopy, particularly those working with confocal microscopy and emission spectrum analysis.