How can I measure the TE TM splitting in Microcavities?

In summary, you need a half wave plate and polarized light to rotate the polarization of the light field. You need to measure in transmission or reflection to find the angle of incidence you need to use.
  • #1
Martin91
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HI all,

I think I have to use some combination of waveplates on the signal, but I am not sure, does anybody know this?

Thanks for help
 
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  • #2
Are you looking at a planar microcavity or is it a structured one, e.g. a micropillar?

Generally speaking, the TE and TM modes are the linear polarizations with either the electric or the magnetic field oriented perpendicular to the plane given by the normal vector of the microcavity plane and the wave vector of the light field. Therefore, the TE-TM splitting will obviously be slightly different for each value of k along the dispersion and it is 0 for normal incidence.

So you need polarized light and a half wave plate to rotate the polarization of the light field. One possible way to do this is to perform angle-resolved reflection or transmission measurements using polarized white light. If you do not know, at which angle you need to put the half wave plates, just rotate them until you find the lowest and highest energies for some given angle. These should appear at orthogonal angles. The splitting is, however, usually not large. Depending on the material, it may be a feww 100 microeV, though.
 
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  • #3
thanks a lot for your answer, basically I just put a lambda half plate in my excitation path and find the highest/lowest energy dispersion on higher k vectors yes? and nothing in my signal path ?

in my case it is a 1 dimensional ridge GaAs
 
  • #4
Martin91 said:
thanks a lot for your answer, basically I just put a lambda half plate in my excitation path and find the highest/lowest energy dispersion on higher k vectors yes? and nothing in my signal path ?

Well, if you already have polarized light, you just put a lambda half plate. Otherwise, you need to place a Glan or some other polarizer in your beam path first of course. What kind of light source will you use? Will you measure in transmission or reflection?

For details on one example system, see G. Panzarini et al., Phys. Rev. B 59, 5082 (1999) and ref. 21 therein.
 
  • #5
thanks for your help so far, is in reflection and a continuous laser, I put a linear polarizer and after it a lambda half plate rotated it, but the dispersion relation did not change, I am not sure if I also have to put something in the detection path?
 
  • #6
This may be difficult. What is the spectral resolution of your detector? What is the resolution with which you can scan the angle of incidence of the light beam? What is the angular width of the beam? The shift you try to see might be very small and it will be 0 at normal incidence.
 

FAQ: How can I measure the TE TM splitting in Microcavities?

1. How can I measure the TE TM splitting in Microcavities?

To measure the TE TM splitting in Microcavities, you can use a technique called angle-resolved photoluminescence spectroscopy. This involves shining a laser beam at different angles onto the microcavity and measuring the emitted light. The angle at which the emitted light is strongest corresponds to the TE or TM mode, and the splitting can be determined from the difference in angles between the two modes.

2. What is the significance of measuring the TE TM splitting in Microcavities?

The TE TM splitting in Microcavities provides important information about the optical properties of the cavity, such as the quality factor and the mode confinement. It can also be used to study the symmetry of the cavity and the presence of any defects or imperfections.

3. What are the limitations of using angle-resolved photoluminescence spectroscopy to measure TE TM splitting?

One limitation is that this technique only works for microcavities with relatively high quality factors, as the splitting is too small to be resolved in lower quality cavities. In addition, the accuracy of the measurement can be affected by the presence of noise or scattering in the system.

4. Are there other methods for measuring TE TM splitting in Microcavities?

Yes, there are other techniques such as angle-resolved reflection spectroscopy and Fourier transform infrared spectroscopy that can also be used to measure the TE TM splitting in Microcavities. Each method has its own advantages and limitations, so the choice of technique will depend on the specific research goals and system being studied.

5. Can the TE TM splitting in Microcavities be controlled or engineered?

Yes, the TE TM splitting in Microcavities can be controlled and engineered through various methods such as changing the cavity geometry, introducing defects, or using materials with different refractive indices. This allows for the design and optimization of microcavities for specific applications in photonics, sensing, and quantum technologies.

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