How does partial pressure of O2 affect thermal oxidation time for Si?

AI Thread Summary
The discussion centers on the use of thermal oxidation of silicon wafers to produce SiO2 for electronic components. A key inquiry involves understanding how the partial pressure of oxygen affects oxidation time during dry oxidation. A participant suggests consulting the classic Deal and Grove paper, which provides a model addressing this question, specifically referencing Figure 8 for detailed insights. The original poster expresses gratitude for this guidance, indicating that their query has been resolved.
Talker1500
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Hi guys,

I'm trying to use thermal oxidation with Si wafers in order to get SiO2 to use for electric components. I've been trying to find out how the partial pressure of the gases used (O2 in this case, it's a dry oxidation) affect the oxidation time, but I haven't been able to find an answer.

I hope anyone can help me with this little dilema, thanks in advance
 
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You must not have tried very hard, I googled "thermal oxidation of silicon" and the first link was to the classic Deal and Grove paper that describes their model. Here is the link. Figure 8 answers your question.
 
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I've had that paper for some time but for some reason I overlooked the last part when I read it.Thank you very much for the answer, this thread can be closed now.
 
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