How does x-ray diffraction from different Bragg planes add up?

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Discussion Overview

The discussion revolves around the computation of powder diffraction spectra using Mathematica, focusing on the treatment of intensity contributions from different Bragg planes and the implications of using structure factors in calculations. The scope includes technical aspects of algorithm development, intensity calculations, and the application of Rietveld fitting in x-ray diffraction analysis.

Discussion Character

  • Technical explanation
  • Mathematical reasoning
  • Debate/contested

Main Points Raised

  • One participant describes an algorithm for generating powder diffraction spectra, questioning whether to add intensities of structure factors at the same Bragg angle or to square them after summation.
  • Another participant states that in a powder, different G vectors correspond to different orientations and that the intensities should be added incoherently.
  • A later reply inquires whether Rietveld fitting accounts for the intensity addition from different orientations.
  • One participant acknowledges that they had previously overlooked the Debye-Waller factor, which resolved discrepancies in their pattern.
  • Another participant explains that common Rietveld fitting codes incorporate various correction factors and can account for the Debye-Waller factor, including its asymmetric nature.

Areas of Agreement / Disagreement

Participants generally agree on the need to add intensities incoherently for different orientations in powder diffraction. However, there is some uncertainty regarding the correct treatment of structure factors and the implications of the Debye-Waller factor in calculations.

Contextual Notes

Participants mention various correction factors and the complexities of Rietveld fitting codes, indicating that the treatment of intensity and structure factors may depend on specific conditions and assumptions in the modeling process.

SadScholar
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I'm writing a little bit of Mathematica code that should be able to make a reasonable powder diffraction spectrum. The algorithm is like this:
Take Bravais lattice and basis. Compute reciprocal vectors.
Compute structure factor (and its square magnitude)
Have triple nested loop that creates ordered triplets of Miller indices. {(h1,k1,l1),(h2,k2,l2)...}
For each of these triplets, compute the momentum transfer vector G (in Kittel. It's K in A&M. Sometimes it's called Q or Δk in other texts). Compute the angle of the peak from Bragg's law and the intensity from the structure factor's square.

OK, this algorithm runs. I look through the list of angles. They all compare perfectly with reference literature. Here's where the real question comes in. I have this list of Miller indices, and each one comes with an angle and an intensity. Sometimes, many many miller indices come at the same Bragg angle, because the MAGNITUDE of G is the same. Should I just add the intensity (structure factor squared) of these so that they make a superpeak at that angle? Was I wrong to square the structure factor in the first place? Should I instead leave it unsquared and then square it only after I've added together all of the structure factors at a given angle? I tried both of these things, and they both yield nonsense in terms of peak intensity. I'm getting anomalously high peaks at high angle. The atomic form factor should be preventing that from happening. Any insight on this would be greatly appreciated.

PS: Debye-Waller factor is not the answer. I'm not at high enough momentum transfer for that to account for the massive discrepancies I see.
 
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In a powder, different G vectors correspond to different orientations, i.e. the diffracted intensity comes from different grains within the powder. There add incoherently, therefore you have to add the intensities.

There are more "correction" factors that take into account the polarization, geometry, etc.

http://reference.iucr.org/dictionary/Lorentz–polarization_correction
 
Thanks for this. Does Rietveld fitting take this kind of thing into account?
 
It looks like I lied. I took the Debye-Waller factor into account, and the pattern showed up perfectly.
 
Common Rietveld fitting codes take all this into account. The Debye-Waller factor can even be asymmetric, giving a "thermal ellipsoid".

The codes calculate a "theoretical" x-ray diffraction pattern from the sample and experimental input parameters, and then optimize the parameters to best match the calculated pattern to the experimental data. How exactly the pattern is calculated, and how you can constrain and limit parameters varies from code to code, but the fundamentals you point out above should be taken into account in any good Rietveld code.
 

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