How the x-ray diffractometer caculate the lattice constant or miller indices?

Click For Summary
SUMMARY

The calculation of lattice constants and Miller indices using an X-ray diffractometer involves applying Bragg's Law, represented as nλ = 2d sin θ, where d is defined for orthorhombic structures as d = 1/{h²/a² + k²/b² + l²/c²}. The diffractometer provides counts and corresponding 2θ values but does not directly yield h, k, l, or a, b, c values. To determine these indices, one must match observed spectra with known compounds and modify lattice parameters based on experimental data to achieve accurate peak positions.

PREREQUISITES
  • Understanding of Bragg's Law and its application in X-ray diffraction.
  • Familiarity with orthorhombic crystal structures and Miller indices.
  • Knowledge of phase identification techniques in X-ray diffraction analysis.
  • Experience with software tools for XRD data analysis.
NEXT STEPS
  • Explore software tools for XRD data analysis, such as FullProf or GSAS.
  • Learn about phase identification methods using X-ray diffraction data.
  • Study the modification of lattice parameters (a, b, c) and angles (α, β, γ) in XRD analysis.
  • Investigate the impact of impurities on crystal structure and XRD spectra interpretation.
USEFUL FOR

Materials scientists, crystallographers, and researchers involved in X-ray diffraction analysis who need to extract structural information from XRD data.

yy.toh
Messages
12
Reaction score
0
Bragg's law n.lambda=2d sin theta. d=1/{h^2/a^2+k^2/b^2+l^2/c^2} for orthorombic structure.

thus d=n.lambda/2 sin theta=1/{h^2/a^2+k^2/b^2+l^2/c^2}
lambda and theta are given.

Look, there are two types/sets of unknowns in the d formula, they are miller indices h, k, l and lattice constant a, b, c. Normally the x-ray diffractometer analysis would give the significant theta according to the count, and also the h, k l and a, b, c. Now I wonder what method the machine has used to figure out the h, k, l and a, b, c?there are two sets of unknown remember?how it is solved by using only one equation?

Looking forward for experts answers...
thanks
 
Physics news on Phys.org
Now I wonder what method the machine has used to figure out the h, k, l and a, b, c?
Diffractometer only gives you the counts and the corresponding 2\theta. It does not give you the hkl or abc.
 
abhi2005singh said:
Diffractometer only gives you the counts and the corresponding 2\theta. It does not give you the hkl or abc.

is that so. Do you know how to determine h, k, l and a, b, c from the XRD data for orthorombic sturcture?
help please...
 
The general approach for extraction of structure information from the XRD data is that you know what elements you have in your material. Then match the observed spectra with that of the various compounds of that element. This gives you the information about the phase formation along with the abc and hkl values.

If you already have some information about the structure (by following above procedure or a priori), then you can use the equations (as given by you) to predict the 2\theta values for given hkl values. This way you can identify as to which peak corresponds which reflection plane. More accurate values are obtained by modifying the abc and \alpha \beta \gamma values in such a way that you get the peak positions matching with the experimental spectra.

More things can also be done, but I guess this suffices for your needs.

All of this procedure can be quite tedious. There are softwares available to do the job.
 
abhi2005singh said:
The general approach for extraction of structure information from the XRD data is that you know what elements you have in your material. Then match the observed spectra with that of the various compounds of that element. This gives you the information about the phase formation along with the abc and hkl values.

If you already have some information about the structure (by following above procedure or a priori), then you can use the equations (as given by you) to predict the 2\theta values for given hkl values. This way you can identify as to which peak corresponds which reflection plane. More accurate values are obtained by modifying the abc and \alpha \beta \gamma values in such a way that you get the peak positions matching with the experimental spectra.

More things can also be done, but I guess this suffices for your needs.

All of this procedure can be quite tedious. There are softwares available to do the job.

please explain more on the \alpha\beta\gamma modification please
 
Last edited:
Most of the times introduction of impurity atoms or due to the other electronic interaction, the structure of the material can deviate from the ideal structure we read in the books. This generally leads to stretching/bending of bonds and bond angles. Such changes may lead to the changes in the angles. This information is available in the XRD spectra of those materials. You need to make changes accordingly in the input values of abc and \alpha\beta\gamma and try to reproduce the experimental spectra.
 

Similar threads

  • · Replies 3 ·
Replies
3
Views
6K
  • · Replies 8 ·
Replies
8
Views
3K
  • · Replies 4 ·
Replies
4
Views
3K
Replies
2
Views
3K
  • · Replies 1 ·
Replies
1
Views
6K
  • · Replies 1 ·
Replies
1
Views
2K
  • · Replies 3 ·
Replies
3
Views
2K
  • · Replies 0 ·
Replies
0
Views
3K
  • · Replies 0 ·
Replies
0
Views
1K
  • · Replies 7 ·
Replies
7
Views
9K