Investigating NMOS Leakage Current with LT Spice

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Discussion Overview

The discussion centers on the behavior of NMOS leakage current as simulated in LT Spice, particularly focusing on the effects of varying gate-source voltage (vGS) and drain-source voltage (vDS). Participants explore the observed leakage current characteristics under different conditions, seeking theoretical explanations and additional resources.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested

Main Points Raised

  • One participant notes that for vGS=0, the leakage current starts at a certain value, decreases suddenly, and then slightly increases with vDS, questioning the theoretical basis for this behavior.
  • Another participant suggests investigating the effects of starting with high vDS and sweeping down to 0, raising concerns about the bias solution when both vGS and vDS are zero.
  • A participant describes their observations when sweeping vDS from 20V to 0V with vGS=0, detailing specific current values and behaviors, and expresses confusion about the behavior at vGS=0.
  • One participant speculates that the model may not accurately represent the subthreshold region, providing a link to a resource for further reading.

Areas of Agreement / Disagreement

Participants express varying levels of understanding regarding the leakage current behavior, with some agreeing on the need for further exploration of the subthreshold region while others remain uncertain about the observed phenomena.

Contextual Notes

Participants acknowledge limitations in their current understanding and the potential inaccuracies in the model used for simulation, particularly in the subthreshold region.

Who May Find This Useful

This discussion may be of interest to those studying semiconductor physics, circuit design, or anyone looking to understand NMOS behavior in simulation environments.

RaduAndrei
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I simulate the NMOS in LT Spice.
And for vGS=0, I observe that the leakage current starts at a certain value then decreases suddenly and then slightly increases with vDS.
For vGS different than 0 (positive or negative) but smaller than the threshold voltage, I observe that the leakage current starts at 0, then increases slightly with vDS.

What is happening? In my textbook it does not tell about this. It only tells that iDS = 0. I know they only approximate but where should I look for more information? What is the theory?
 
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What happens if you start with high Vds and then sweep down to 0? I'm wondering whether the bias solution is at issue when Vgs and Vds are both zero.
 
If I sweep Vds from 20V to 0V with vGS = 0, then iDS starts at 60pA, then it falls very slowly, then at vDS = 1V or so, it quickly rises to 400pA. (see picture)
If vGS is not 0 but lower than Vt, then iDS starts at 54 pA, then it falls until vDS = 1 with some slope, then after vDS = 1, it quickly falls to 0 pA or so.

If vGS is greater than Vt, then iDS starts at the saturation current, then it stays constant, then it falls to 0. This part I understand.

I would say that I also understand the part where vGS is not 0 but lower than Vt. For a given vGS, the leakage current increases with increasing vDS. It's common sense.
But for vGS = 0, I do not understand what is happening or where to look.
 

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Ok, thanks.
 

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