- #1
Sankhadeep Bose
- 1
- 0
What are the different signals we obtain from TEM and How can we distinguish between them? what are the significances of those signals?
Transmission electron microscopy (TEM) is a powerful imaging technique that uses a beam of electrons to create high-resolution images of a sample. Unlike light microscopy, TEM has a much higher resolving power and can reveal intricate details of a sample's internal structure.
The two main types of signals used in TEM are secondary electrons and backscattered electrons. Secondary electrons are low energy electrons that are emitted from the sample's surface, while backscattered electrons are higher energy electrons that are scattered off the atoms in the sample. These signals can provide information about a sample's topography, composition, and crystal structure.
The type of signal used in TEM is important because it determines the type of information that can be obtained about a sample. Secondary electrons are useful for imaging surface features, while backscattered electrons can provide information about the sample's composition and crystal structure. By using different signals, scientists can gain a more comprehensive understanding of a sample's properties.
The type of signal used in TEM is typically selected by adjusting the energy of the electron beam. Lower energy beams are more likely to produce secondary electrons, while higher energy beams produce more backscattered electrons. In addition, the type of detector used can also affect the type of signal collected.
TEM has a wide range of applications in various scientific fields, including materials science, biology, and nanotechnology. It can be used to study the structure and properties of materials, investigate cellular structures and functions, and visualize nanoparticles and other small structures. TEM is also used in the development and quality control of electronic and semiconductor devices.