Discussion Overview
The discussion revolves around the positive temperature coefficient of Rdson in FETs compared to the negative temperature coefficient observed in semiconductors. Participants explore the underlying mechanisms affecting charge carrier behavior and resistance in these devices as temperature changes.
Discussion Character
- Technical explanation
- Conceptual clarification
- Debate/contested
Main Points Raised
- One participant expresses confusion regarding why Rdson has a positive temperature coefficient, contrasting it with the negative temperature coefficient of semiconductors.
- Another participant explains that in semiconductors, increased temperature leads to more electron-hole pairs being generated, which decreases resistivity due to greater carrier abundance.
- The same participant notes that FETs rely on inversion rather than thermally generated carriers, leading to different temperature characteristics.
- It is mentioned that as temperature increases, collisions between electrons and the lattice structure increase, resulting in higher resistance due to inelastic collisions.
- Additional points are raised about how the p-type substrate in FETs generates more electron-hole pairs at higher temperatures, which affects the effective number of charge carriers and increases resistance.
- A reference is provided that suggests FETs may have a nearly zero temperature coefficient, indicating variability in temperature behavior among different devices.
- An anecdote is shared about a successful circuit design using an FET as a current source due to its nearly zero temperature coefficient, contrasting with the failure of a zener-based design.
Areas of Agreement / Disagreement
Participants present multiple competing views regarding the temperature behavior of Rdson in FETs versus semiconductors, and the discussion remains unresolved with no consensus reached.
Contextual Notes
Some limitations include the dependence on specific definitions of temperature coefficients and the conditions under which the behaviors of FETs and semiconductors are compared. The discussion does not resolve the complexities of these relationships.