ZapperZ said:
It's nonsense because you didn't understand what I just said.
The accuracy of a single measurement depends on the accuracy of your instrument. Now do you dispute this? Let's get that out of the way first.
Now, if you make repeated measurement of the SAME thing (i.e. of the width of the slit, for example), then you will have an average value, and a standard deviation of the width of the slit based on the repeated measurement. However, each of the measurement in your data set is accompanied by its own uncertainty based on the uncertainty of a single measurement. This is the uncertainty that I'm talking about, and it has nothing to do with the HUP. That is the uncertainty of the instrumentation. If I was using a ruler to measure the width of the slit, I get a certain amount of uncertainty. If I instead switch to a micrometer caliper, then I have a smaller uncertainty in that measurement because I just switched to a more accurate derive that measures a length. So now I've just reduced the uncertainty of my length measurement with no regards to what is going on before and after that measurement. What is nonsense is to confuse that with the HUP.
Zz.
ZapperZ, it was very clear what you intended with accuracy of a single measurement (= accuracy of the instrument) and the fact HUP concerns repeated measurement of the same thing.
What I wanted to discuss are 2 different things:
1. Independently on HUP, but talking about measurements in general, I don't understand how is possible to define the accuracy of a single measurement as the accuracy of the instrument - let's say 0.01 mm of something - if, repeating many times that measure with the same instrument, we have a standard deviation of 10 mm, for example. It was just a statistical consideration. Certainly, with only one measurement we have
nothing else than the instrument's accuracy, but, IMO, we should never estimate the experiment accuracy from one only measurement, we should make at least two of them if we want to give a reasonable value of it (reasonable in the sense I wrote).
2. It's not clear to me if it's possible or not (as you say) to measure x and p of, let's say, a photon, simultaneously. This is because, infact, I'm now more confused on what we mean with "measure of position" and "measure of momentum".
Let's set, e.g., the following situation:
A plane, monocromatic electromagnetic wave traveling along the +z direction hits a screen with a slit, which width is d along the x direction (and D>>d in the y direction) and then hits a final screen parallel to the first and at distance L from it (so, a very standard arrangement).
According to what is written in some books (see, for example, A.Messiah - ch. 4, par.13), the light passing through the slit correspond to a position measurement of photons, with \Delta x = d and to a momentum measurement with \Delta p_x = p\cdot\sin\alpha where \alpha is the angle of diffraction. Now I ask, since this is not stated: does it mean that the position measurement is performed
before the momentum measurement?
Thank you for your patience.