The discussion centers on the relationship between diffraction intensity and band structure in materials, particularly in the context of optical microscopy. Participants clarify that diffraction typically relates to periodic structures, while the observed intensity in the user's case may stem from scattering rather than true diffraction. The user is examining a 2D silicon sample using dark field microscopy, which limits the observed light to that scattered by edges, raising questions about the visibility of the sample. It is suggested that the intensity could be influenced by factors such as the index of refraction and potential fluorescence rather than direct band structure effects. Ultimately, the conversation highlights the complexities of interpreting optical phenomena in thin samples.