Quartz Crystal Microbalance (QCM) measures film thickness by detecting changes in the resonant frequency of a quartz crystal as material is deposited on it. The principle relies on the fact that added mass lowers the frequency of oscillation, allowing for precise measurement of film thickness based on calibrated frequency shifts. QCM operates effectively at room temperature and up to 65 degrees Celsius, with temperature variations having a minimal impact on frequency shifts, which can be compensated for during calibration. The device is commonly used in ultra-high vacuum environments for monitoring thin film deposition in semiconductor applications. Understanding the relationship between frequency changes and film thickness is crucial for accurate measurements in various temperature conditions.