Residual stress in 3 layer cantilever beam

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Discussion Overview

The discussion revolves around calculating residual stress in a three-layer cantilever beam made of titanium, silicon dioxide, and silicon. Participants explore methods for predicting residual stress as a function of depth in each layer, particularly in the context of using a Focused Ion Beam system for material removal and measuring deflection.

Discussion Character

  • Exploratory, Technical explanation, Debate/contested

Main Points Raised

  • One participant, Toby, seeks assistance in calculating residual stress through the thickness of the layers and expresses confusion about finding the neutral axis after removing thin layers.
  • Toby mentions using Stoney's equation to obtain average stress after complete layer removal but is uncertain about predicting stress at various depths.
  • Another participant suggests using SolidWorks and COSMOS for stress calculations, indicating that a friend successfully used these tools for similar work.
  • Toby responds that he does not have access to SolidWorks or COSMOS but does have access to MATLAB and DaVis 7.2, and expresses interest in connecting with the individual who has experience with those software packages.
  • Toby also discusses modeling residual stress in thin films using the slot method, which involves milling a slot and measuring stress relaxation through relative movements of the top surface.
  • A participant proposes moving the question to the General Physics forum for broader input, indicating the complexity of the issue.

Areas of Agreement / Disagreement

The discussion remains unresolved, with multiple competing views on the best methods and tools for calculating residual stress. Participants have not reached a consensus on the approach to take.

Contextual Notes

Participants have not fully addressed the assumptions involved in their methods, such as the dependence on material properties and the specific conditions of the milling process. The discussion also reflects uncertainty regarding the application of different software tools and methods.

soiree
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Hi guys & girls,
I have a problem, I am trying to calculate the residual stress as a function of depth of each layer.

I am using a Focused Ion Beam system to milling/removal thin layers of material from each layer of this cantilever, & measuring the deflection.

I can obtain the average stress in each layer after removing the whole layer by using Stoney's equation. But am trying to predict / calculate the residual stress through the thickness of the layers.

The main problem I am having is that I have no idea how to find the neutral axis each time i remove a thin layer of each of the different layers.

the beam is made of Ti, SiO2, & Si. with Young's modulus 110, 85, 130 G Pa respectively.

Can anyone help?! I am so confused!:confused:
Cheers
Toby
 
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DO you have access to a PC with Solid works and COsmos... a friend of mine made all stress calculations of our graduation robot on this software. if you'r interrested, tell me and i'll put you in touch with him.
 
HI Ikalogic,
no i don't have access to to either of those packages; i do have access to Matlab & DaVis 7.2.

If you wouldn't mind putting me in touch with him that would be great!

I am also trying to model the residual stress as a function of thickness in thin films using the slot method [i.e. milling a slot of know length, width, depth & looking at the stress relaxation / by measuring relative movements of the top surface before & after milling the slot].

Much appreciated!
 
I'd like to try moving this question from the EE forum to the General Physics forum for a bit. This is a complicated question that deserves a wider set of views.
 

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