Scanning Electron Microscope Images

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SUMMARY

The discussion centers on the impact of scanning direction on images produced by Scanning Electron Microscopes (SEMs). SEMs utilize deflecting coils to move the electron beam primarily along the x-axis while traversing down the y-axis. The participants assert that while the resulting images should theoretically be the same regardless of scanning direction, various factors such as sample stability and environmental conditions can introduce discrepancies. Testing by rotating the sample 90 degrees is suggested as a practical method to evaluate any differences in image quality.

PREREQUISITES
  • Understanding of Scanning Electron Microscopy (SEM) principles
  • Familiarity with electron beam deflection mechanisms
  • Knowledge of sample preparation and stability in microscopy
  • Experience with image analysis in microscopy
NEXT STEPS
  • Research the effects of sample temperature fluctuations on SEM imaging
  • Explore the principles of electron beam deflection in SEMs
  • Learn about the differences between Scanning Electron Microscopes and Scanning Tunneling Microscopes
  • Investigate methods for minimizing artifacts in SEM images
USEFUL FOR

Microscopists, materials scientists, and researchers involved in imaging techniques who seek to understand the nuances of SEM operation and image quality optimization.

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Would the resulting image by a scanning electron microscope be different if it scanned across the y-axis?

SEMs have deflecting coils that move the electron beam from left to right (x-axis) rapidly while traversing down the y-axis to cover the entire specimen.

Would the image you get after be different if it was moving the beam from up to down (y-axis) while slowly moving from left to right?
 
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I think they are the same. You could try testing it by rotating the sample 90 degrees to see if you still get the same image. That's what my lab does with the AFM.
 
It could be. It really shouldn't be, but there are a whole lot of things that could be going on, from control systems not being perfectly in tune, to any small changes to the sample while you're scanning. For example, if the sample is heating/cooling while the scan is in progress, the expanding/shrinking of the sample will have different effect on the image depending on whether you're scanning in x or y direction.

I've never used an electron microscope, but I've played with a scanning tunneling microscope, and you could clearly see scan-lines on the final image, simply due to the way that z-hold circuit responded to changes in tunneling current.
 

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