X-Ray Disappearance Due to Size Effect: A Troubleshooting Guide

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Discussion Overview

The discussion revolves around the phenomenon of X-ray disappearance in the context of nano-porous materials, specifically addressing issues related to X-ray diffraction and the effects of size on X-ray peak visibility. Participants explore potential causes and troubleshooting methods related to this issue.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested

Main Points Raised

  • Some participants inquire about the meaning of "X-ray disappearing" and the specific context, questioning whether it refers to X-ray diffraction or characteristic X-ray generation.
  • One participant describes their experience with nano-porous materials, noting that X-ray peaks are absent in these samples compared to bulk materials.
  • A participant shares a related experience with a Bragg crystal diffraction spectrometer, discussing how bending the crystal affects angular resolution and raises questions about the impact of small mosaic domains.
  • Another participant suggests that the width of X-ray peaks can be influenced by factors such as grain size and residual stress, and recommends scanning slowly to distinguish low-height peaks from background noise.
  • There is mention of using insitu grain-refinement techniques and the importance of sample preparation in obtaining clear X-ray peaks.

Areas of Agreement / Disagreement

Participants express varying perspectives on the causes of X-ray disappearance, with no consensus reached on the underlying mechanisms or solutions. Multiple competing views remain regarding the effects of size and material structure on X-ray visibility.

Contextual Notes

Some discussions involve assumptions about the nature of the materials and the specific experimental setups used, which may not be fully detailed. The impact of sample preparation techniques and the characteristics of nano-structured materials are also noted but not resolved.

Lei Wang
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Hi, guys. Did you ever encounter the problem of X-ray disappearing caused by size effect?
 
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Lei Wang said:
Hi, guys. Did you ever encounter the problem of X-ray disappearing caused by size effect?
What does one mean by 'X-ray disappearing'? Size of what?

X-rays can be scattered or absorbed (e.g., photo-electric effect).
 
Hi, thanks.

I am doing some research about nano porous materials. The bulk materials, I can get a X-ray peak for each element. But when I made it into nano porous material, the peak is gone. The same thing happened to my teammates. In one word, we can't get X ray for a nano-porous material.
 
Lei Wang said:
Hi, thanks.

I am doing some research about nano porous materials. The bulk materials, I can get a X-ray peak for each element. But when I made it into nano porous material, the peak is gone. The same thing happened to my teammates. In one word, we can't get X ray for a nano-porous material.
Is one referring to X-ray diffraction? Or is one referring to generating characteristic X-ray by electron bombardment?
 
It X-ray diffraction.
 
I had a vaguely similar problem when I built a Bragg crystal diffraction spectrometer (Dumond geometry) many years ago. For the quartz 310 crystal (20 cm x 20 cm x 6 mm), the intrinsic angular resolution is of the order of 1 second of arc when it is flat. However, when it is bent (yes, quartz can be bent) to a 7.7 meter radius of curvature, "mosaic domains" in the quartz broadens the intrinsic angular resolution to about 15 seconds of arc. This has been observed in other bent quartz crystals, and also I believe in other crystals, like silicon. I have no idea what happens when the mosaic domains are very small. The reference I have for this is a book by Zachariasen "Theory of X-Ray Diffraction in Crystals" , which was republished by Dover and is available through Amazon.com.
 
The width of your peak is a function of several things, including grain size, and residual stress/strain (sample prep, thermal strain...). Are your raw materials nano-structured? Or are you using a insitu grain-refinement technique? If your are losing your peaks due to grain refinement try scanning the angle where you know the peaks should be, but very slowly to try and increase the number of counts, sometimes this will make it easier to distinguish a very low height, high width peak, from the background. I just worked on this today, so I'll attach a figure displaying what I mean.

I hope this helps.
 

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  • XRD Plot Edited.jpg
    XRD Plot Edited.jpg
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Thanks, I got that book in our library.
 
Dave_H said:
The width of your peak is a function of several things, including grain size, and residual stress/strain (sample prep, thermal strain...). Are your raw materials nano-structured? Or are you using a insitu grain-refinement technique? If your are losing your peaks due to grain refinement try scanning the angle where you know the peaks should be, but very slowly to try and increase the number of counts, sometimes this will make it easier to distinguish a very low height, high width peak, from the background. I just worked on this today, so I'll attach a figure displaying what I mean.

I hope this helps.

Thanks a lot. I see what you are talking. I will try a small and slow scan.
 

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