Determining semiconductor type of Schottky barrier using IV

In summary, the semiconductor type of a Schottky barrier can be determined by measuring the current-voltage (IV) characteristics of the device. The determination can be affected by factors such as temperature, doping concentration, and device aging. However, there are limitations to using IV measurements, such as low barrier heights. Alternative methods, such as capacitance-voltage (CV) measurements and X-ray photoelectron spectroscopy (XPS), can also be used to determine the semiconductor type.
  • #1
christian wurm
2
0
I was wondering if it would be possible to determine if a Schottky diode was n-type of p-type (in the bulk) by only using I-V measurements?
 
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  • #2
No, it would not be possible to determine if a Schottky diode is n-type or p-type based on I-V measurements alone. In order to determine the type of dopant (n-type or p-type) in a Schottky diode, you would need to analyze the device under an electron microscope and use electrical tests to measure the impurity concentration.
 

1. How is the semiconductor type of a Schottky barrier determined using IV measurements?

The semiconductor type of a Schottky barrier can be determined by measuring the current-voltage (IV) characteristics of the device. This involves applying a small voltage across the barrier and measuring the resulting current. By analyzing the slope of the IV curve, the semiconductor type can be determined.

2. What factors affect the determination of semiconductor type using IV measurements?

There are several factors that can affect the determination of semiconductor type using IV measurements. These include the temperature of the device, the doping concentration of the semiconductor material, and the contact resistance between the metal and semiconductor layers.

3. Can the determination of semiconductor type using IV measurements be affected by device aging?

Yes, device aging can affect the determination of semiconductor type using IV measurements. As the device ages, its electrical properties may change, which can impact the IV characteristics and make it more difficult to accurately determine the semiconductor type.

4. Are there any limitations to using IV measurements for determining semiconductor type of Schottky barriers?

Yes, there are some limitations to using IV measurements for determining semiconductor type of Schottky barriers. For example, if the barrier height is too low, the IV curve may not exhibit a clear slope and the semiconductor type may be difficult to determine.

5. Are there alternative methods for determining the semiconductor type of Schottky barriers?

Yes, there are alternative methods for determining the semiconductor type of Schottky barriers. These include capacitance-voltage (CV) measurements, which can provide information about the doping concentration of the semiconductor material, and X-ray photoelectron spectroscopy (XPS), which can analyze the chemical composition of the barrier and determine the semiconductor type.

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