XRD data: particle size, cell size etc

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SUMMARY

The discussion focuses on interpreting X-ray diffraction (XRD) data collected from room temperature to high temperature and back. Key observations include a consistent shift of peaks to the right, decreasing peak intensities, and widening of peaks, indicating potential changes in particle size and unit cell dimensions. The phase remains unchanged, suggesting that the variations are due to experimental conditions rather than structural transformations. Participants recommend using GPDS cards or handbooks for calculating Miller indices and analyzing XRD patterns.

PREREQUISITES
  • Understanding of X-ray diffraction (XRD) techniques
  • Familiarity with Miller indices and their calculation
  • Knowledge of GPDS cards and crystallographic databases
  • Basic principles of crystallography and unit cell parameters
NEXT STEPS
  • Research how to calculate particle size using the Scherrer equation
  • Learn about the relationship between peak width and crystallite size
  • Explore the use of Rietveld refinement for detailed XRD analysis
  • Investigate temperature effects on XRD patterns and phase stability
USEFUL FOR

Researchers in materials science, crystallographers, and anyone involved in analyzing XRD data for temperature-dependent studies will benefit from this discussion.

Oxygenne
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I use to do XRD from room temperature to High temperature and then cooling again at room temperature.
I see there is constant going to the right for all the peaks and also their intensities are decreasing, also the width of peaks is becoming larger.
I would like to interpret those data and also to calculate the particle size and the unit cell size (if there is a change with the temperature).
It seems the phase is not change only the garbages and the intensities values.
Could you help me to interpret those data or to guide to read something on the web to help me with this?
Thank you!
 
Last edited:
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Thank you drizzle!
On an Intensity vs. 2*theta plot of a powdered, crystalline sample how to calculate the miller indices?
 
I think to determine the miller indices of each peak [the surface where the diffraction occur] you would need to use GPDS cards or a handbook [it’s a catalogue that holds the analyzed XRD data of almost all structures and compounds, will maybe not all, it depends on the book]. it goes like this; in your XRD pattern you would see several peaks, each at a precise angle. say that your XRD pattern is of the material ZnO and the first peak is at 35 degrees, you then should look for ZnO in that data and find the matched angle thus the corresponding surface, you would find tables of different data, i.e.

XRD pattern for ZnO:

(hkl) 2θ relative intensity
100 35° 87.5
102 47° 63
etc

also it could be calculated.
 
I would like to calculate taking in account the data I have (Intensity vs. 2*theta plot)

I found a formula but there is included the unit cells parameters and I do not want to use that, because my goal is to find the unit cell parameter using the recorded data for each set of data.

* How to interpret the constant moving of my intensities to the right with each temperature step?

*How to interpret the constant decreasing in intensity of every peak with each temperature step?

Thank you!
 
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