The discussion centers on whether there is a phase change during total internal reflection, particularly when a thin layer of glass is applied over copper to reflect 200 MHz electromagnetic waves from water. It is noted that the thin glass layer should not significantly affect the phase, as the copper's high conductivity leads to minimal penetration and a reflection coefficient close to -1. The phase shift at the water/glass interface is discussed, with acknowledgment that a 180-degree phase shift occurs for one component due to the change in direction. Calculations indicate that the total reflection coefficient remains approximately -1, suggesting no substantial phase alteration from the thin dielectric layer. Overall, the consensus is that the thin glass layer does not meaningfully impact the phase during total internal reflection.