Complex refractive index mesurement from reflectivity data

AI Thread Summary
To determine the complex refractive index from reflectivity measurements at a single angle, the Kramers-Kronig relations are often utilized, although users seek direct calculation methods. The discussion highlights the relationship between the reflection ratios of plane and parallel polarized light, expressed as Ps/Pp = tan(Phi)exp(ixdelta), indicating a remaining unknown. Ellipsometry is noted as a direct measurement technique for n, k, and e1, e2. For reflectivity data obtained from a photospectrometer, a formula involving R=(n-1)^2+K^2/(n+1)^2+K^2 is suggested, with a reminder to consider multiple reflections. The conversation emphasizes the complexity of deriving the refractive index without relying on Kramers-Kronig relations.
Gobil
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hi All,

Just wondering how you get the complex refractive index of a material from relectivity measurements at a single angle. I understand you must infer some of the data, using the Kramers Kronig relations, is this right?

Is there a direct way of calculating it? I see from an article on elipsometry that is you have the ratio of the reflction of plane and parallel polarised light

from wiki

Ps/Pp = tan(Phi)exp(ixdelta)

where delta is the phase shift, and the amplitued is tan(Phi), but here you still have one unkown. Any ideas on doing this without the kramers kronig relation?

cheers
Gobil
 
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ellipsometry measures n, k and e1, e2 directly. however if you have reflectivity data from photospectrometer then you may use R=(n-1)^2+K^2/(n+1)^2+k^2, you will have to account for multiple reflections
 
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