Exponental Tunnelling Factor (Electron Microscope)

In summary, the Exponential Tunnelling Factor (ETF) is a measure of the probability of an electron tunneling through a barrier and is an important factor in image contrast and resolution in electron microscopy. It is calculated using the Schrödinger equation, which takes into account the energy of the electrons, the thickness of the specimen, and the properties of the surrounding materials. The ETF is influenced by factors such as the energy of the electrons, specimen thickness, materials composition, and microscope voltage and geometry. A higher ETF leads to stronger contrast and higher resolution images. To optimize the ETF, adjustments can be made to the energy of the electrons, specimen thickness, surrounding materials, voltage, and microscope geometry.
  • #1
ZedCar
354
1
I'm reading a little bit about electron microscopes.

It states, "the exponential tunnelling factor is proportional to the square root of the mass. So, the lower mass means lower exponential decay of the wavefunction".

Would anyone be able to let me know what this exponential tunnelling factor is?

I presume it looks something like exp() proportional to (mass)^0.5

Thanks you!
 
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  • #2
Actually, does it look something like:

P is proportional to exp(-alpha x a)

If so, what does alpha and a represent?
 

1. What is the Exponential Tunnelling Factor (ETF) in electron microscopy?

The Exponential Tunnelling Factor (ETF) is a measure of the probability of an electron tunneling through a barrier. In electron microscopy, it is used to describe the likelihood of electrons passing through a thin specimen, and is an important factor in image contrast and resolution.

2. How is the Exponential Tunnelling Factor (ETF) calculated?

The ETF is calculated using the Schrödinger equation, which takes into account the energy of the electrons, the thickness of the specimen, and the properties of the surrounding materials. The equation also includes a term for the potential barrier, which reflects the interactions between the electrons and the atoms in the specimen.

3. What factors affect the Exponential Tunnelling Factor (ETF) in electron microscopy?

The ETF is influenced by several factors, including the energy of the electrons, the thickness of the specimen, the composition and properties of the materials surrounding the specimen, and the voltage and geometry of the electron microscope. Changes in any of these factors can impact the ETF and therefore affect the quality of the microscopy image.

4. How does the Exponential Tunnelling Factor (ETF) affect the resolution of electron microscopy?

The ETF directly impacts the resolution of electron microscopy because it determines the contrast of the image. A higher ETF means a stronger contrast, which allows for better differentiation of small structures in the specimen. Therefore, a higher ETF can lead to higher resolution images.

5. How can the Exponential Tunnelling Factor (ETF) be optimized in electron microscopy?

The ETF can be optimized by adjusting the energy of the electrons, the thickness of the specimen, and the properties of the surrounding materials. Additionally, using a higher voltage and optimizing the geometry of the electron microscope can also improve the ETF and therefore, the resolution of the microscopy image.

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