Fringe Field of an asymmetrical parallel capacitor

AI Thread Summary
The discussion centers on calculating the fringe field of an asymmetrical parallel plate capacitor, where one electrode is significantly larger than the other. The user seeks to determine the fringe field component parallel to the SiO2 surface at the edge of a small metal electrode. A suggestion is made to use an image electrode method, with an initial misunderstanding regarding the gap thickness, which is clarified to be 600 nm. The focus is on calculating the horizontal fringe field, with advice given to first calculate the field of a symmetric capacitor with the specified gap. The conversation highlights the complexity of the calculations involved.
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I have a problem bothering me for a long time. Here it is: suppose I have an asymmetrical parallel plate capacitor with one electrode much larger than the other. For example, the capacitor could be made by depositing small-area metal electrode on heavily doped wafer with 300 nm thermal oxide. Is there a way to calculate the fringe field component parallel to the SiO2 surface at the edge of the small metal electrode? A figure is attached to make the question clear. Thanks.
 

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The bottom electrode seems large enough to consider as an infinite plane.
Then you could use an image electrode, so the the field would be that of a capacitor with a
6 nm gap.
 
Thanks. Could you please give some details on how you got the 6 nm thickness?
 
Sorry. I meant 600 nm, twice the space on the picture.
 
Sorry I am still a little bit confused. Is the field calculated with 600 nm thickness vertical or horizontal? I am interested in the horizontal fringe field.
 
It's not an easy calculation, but you calculate the fringe field of a symmetric capacitor with 600 nm between the plates.
 
Thanks, I will try that.
 
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